W. V. van Driel, A. Grech, T. Hauck, I. Schmadlak, X. Zhang, S. Orain
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Finite element techniques are widely used to predict the deformations and stresses and their evolution during IC processes, packaging manufacturing processes and/or product testing. Modeling techniques such as contact elements, global-local, sub-structuring, element birth and death and material models such as fracture mechanics, visco-elasticity, plasticity and creep are rapidly developed to predict the stress and strain state in the electronic package. Still, experiments are necessary to verify the calculated results in order to be sure that the results obtained from FE models are reliable and accurate enough from both quantitative and qualitative perspective. No doubt that to first-time-right develop CMOS065 and beyond will require the use of combined state-of-the-art modeling and experimental techniques. 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引用次数: 11
摘要
工业对小型化和功能集成的持续推动迫使特征尺寸的发展下降到纳米级别。虽然业界刚刚解决了CMOS090技术的主要问题,但一个新的障碍是要采取:CMOS065。同样,新材料也会被引入。CMOS090中使用的黑金刚石- i将被黑金刚石- ii (x)所取代。这种新材料是多孔的,因此不再是一种均匀的材料。可以肯定的是,这将对整个集成电路堆栈的热力学性能产生重大影响。在CMOS090期间遇到的问题至少表明IC和封装可靠性(以及PCB?)是强烈相互作用的。有限元技术被广泛用于预测集成电路过程、封装制造过程和/或产品测试过程中的变形和应力及其演变。接触单元、整体-局部、子结构、单元生灭等建模技术和断裂力学、粘弹性、塑性和蠕变等材料模型迅速发展,用于预测电子封装内部的应力和应变状态。然而,为了从定量和定性的角度确保有限元模型得到的结果足够可靠和准确,还需要进行实验来验证计算结果。毫无疑问,要首次正确开发CMOS065及以后的产品,将需要使用最先进的建模和实验技术相结合。这将使行业不仅能够在早期阶段预测电子封装中热机械引起的故障,而且还可以了解所涉及的精确故障机制。为了加强发展,业界领袖意法半导体、飞利浦和飞思卡尔之间成立了Crolles2联盟。作为联盟的一部分,由每个公司建模团队的代表组成的CAA建模合作组织开始用最先进的虚拟原型技术协助65节点的开发。本文重点介绍了该合作迄今取得的主要研发成果
Virtual Prototyping based Design Optimization of the Substrate, Leadframe, and Flip Chip Package Families with Low-k Technology
The continuous industry drive for miniaturization and function integration forces the development of feature sizes down to the nanometer regime. Although the industry has just solved the major problems in CMOS090 technology, a new hurdle is to be taken: CMOS065. And again, new materials will be introduced. Black Diamond-I, used in CMOS090, will be replaced by Black Diamond-II(x). This new material is porous and, thus, not being a homogeneous material any more. For sure that this will have major impacts on the thermomechanical performance of the total IC stack. The problems encountered during CMOS090 at least showed that IC and package reliability (and PCB?) are strongly interacted. Finite element techniques are widely used to predict the deformations and stresses and their evolution during IC processes, packaging manufacturing processes and/or product testing. Modeling techniques such as contact elements, global-local, sub-structuring, element birth and death and material models such as fracture mechanics, visco-elasticity, plasticity and creep are rapidly developed to predict the stress and strain state in the electronic package. Still, experiments are necessary to verify the calculated results in order to be sure that the results obtained from FE models are reliable and accurate enough from both quantitative and qualitative perspective. No doubt that to first-time-right develop CMOS065 and beyond will require the use of combined state-of-the-art modeling and experimental techniques. It will enable the industry not only to predict thermo-mechanically induced failures in electronic packages in early stages, but also to understand the precise failure mechanisms involved. To strengthen the development, the Crolles2 Alliance was founded between the industry leaders STMicroelectronics, Philips, and Freescale. As part of the Alliance, the CAA Modeling Cooperation, consisting of the representatives of each companies modeling team started to assist the 65-node development with state-of-the-art virtual prototyping techniques. This paper highlights the major research and development results of that cooperation so far