用原子力声显微镜和压响应力显微镜在铁电陶瓷中绘制纳米级畴图

Faxin Li, Xilong Zhou, H. Zeng
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引用次数: 11

摘要

利用压电力显微镜(PFM)和原子力声显微镜(AFAM)在同一扫描区域内研究了铁电陶瓷的纳米结构。单频AFAM和共振跟踪AFAM成像的畴图与PFM成像的畴图相当。同时,利用AFAM可以观察到表面下的畴结构,并实现了畴的定量纳米力学制图。最后,我们认为PFM + AFAM应该是表征铁电畴的最佳选择。
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Mapping nanoscale domain patterns in ferroelectric ceramics by atomic force acoustic microscopy and piezoresponse force microscopy
In this paper, nanoscale domain patterns of ferroelectric ceramics were investigated by both piezoelectric force microscopy (PFM) and atomic force acoustic microscopy (AFAM) in the same scanning area. The domain patterns imaged by both the single-frequency AFAM and resonance-tracking AFAM are comparable to that by PFM. Meanwhile, using AFAM, the subsurface domain structures can be observed and quantitative nanomechanical mapping of domains was also realized. Finally, we suggest that PFM plus AFAM should be the best choice for characterization of ferroelectric domains.
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