大功率QCW-AlGaAs/GaAs 808nm cm- bar的可靠性

G. Lu, Yun Huang, Y. En, Shaohua Yang, Z. Lei
{"title":"大功率QCW-AlGaAs/GaAs 808nm cm- bar的可靠性","authors":"G. Lu, Yun Huang, Y. En, Shaohua Yang, Z. Lei","doi":"10.1109/SOPO.2009.5230296","DOIUrl":null,"url":null,"abstract":"The reliability, long-term performance and lifetime of high power diode lasers are important issues for pumping of solid state and fiber laser systems. In order to obtain the lifetime data of high power QCW 808nm cm-bars, we have set up a computer controlled diode array reliability experiment which can automated monitor the laser arrays 24 hours a day. Using this setup 10 high power QCW cm-bars currently being tested was operated for more than 5.4 billion shots at 25 0 C with a pulse width of 200us and a duty factor of 2%, and one cm-bars suffered sudden failure at 3.24x10 7 shots, one cm-bars had reached the failure criterion at 1.98 billion shots. The failure analysis of these two failed device were reported on this paper. Keywords-reliability, laser diode, lifetime, sudden failure, failure analysis.","PeriodicalId":6416,"journal":{"name":"2009 Symposium on Photonics and Optoelectronics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2009-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reliability of High Power QCW-AlGaAs/GaAs 808nm cm-Bars\",\"authors\":\"G. Lu, Yun Huang, Y. En, Shaohua Yang, Z. Lei\",\"doi\":\"10.1109/SOPO.2009.5230296\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reliability, long-term performance and lifetime of high power diode lasers are important issues for pumping of solid state and fiber laser systems. In order to obtain the lifetime data of high power QCW 808nm cm-bars, we have set up a computer controlled diode array reliability experiment which can automated monitor the laser arrays 24 hours a day. Using this setup 10 high power QCW cm-bars currently being tested was operated for more than 5.4 billion shots at 25 0 C with a pulse width of 200us and a duty factor of 2%, and one cm-bars suffered sudden failure at 3.24x10 7 shots, one cm-bars had reached the failure criterion at 1.98 billion shots. The failure analysis of these two failed device were reported on this paper. Keywords-reliability, laser diode, lifetime, sudden failure, failure analysis.\",\"PeriodicalId\":6416,\"journal\":{\"name\":\"2009 Symposium on Photonics and Optoelectronics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 Symposium on Photonics and Optoelectronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SOPO.2009.5230296\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Symposium on Photonics and Optoelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SOPO.2009.5230296","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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摘要

高功率二极管激光器的可靠性、长期性能和寿命是固态和光纤激光器抽运系统的重要问题。为了获得大功率QCW 808nm cm棒的寿命数据,我们建立了一个计算机控制的二极管阵列可靠性实验,该实验可以24小时自动监测激光阵列。使用该装置,目前正在测试的10个高功率QCW cm-bars在250℃下,脉冲宽度为200us,占空系数为2%,运行了超过54亿次,其中1个cm-bars在3.24 × 10.7次射击时突然失效,1个cm-bars在19.8亿次射击时达到失效标准。本文对这两种失效装置进行了失效分析。关键词:可靠性,激光二极管,寿命,突然失效,失效分析。
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Reliability of High Power QCW-AlGaAs/GaAs 808nm cm-Bars
The reliability, long-term performance and lifetime of high power diode lasers are important issues for pumping of solid state and fiber laser systems. In order to obtain the lifetime data of high power QCW 808nm cm-bars, we have set up a computer controlled diode array reliability experiment which can automated monitor the laser arrays 24 hours a day. Using this setup 10 high power QCW cm-bars currently being tested was operated for more than 5.4 billion shots at 25 0 C with a pulse width of 200us and a duty factor of 2%, and one cm-bars suffered sudden failure at 3.24x10 7 shots, one cm-bars had reached the failure criterion at 1.98 billion shots. The failure analysis of these two failed device were reported on this paper. Keywords-reliability, laser diode, lifetime, sudden failure, failure analysis.
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