{"title":"基于mems静电场传感器的CMOS数字化峰值检测器","authors":"Guoping Cui, Haigang Yang, S. Xia","doi":"10.1109/NANO.2007.4601155","DOIUrl":null,"url":null,"abstract":"This paper presents a new CMOS peak detector that directly converts the peak of a sine wave signal to its digital representation. This peak detector is capable of capturing peak points that carry the information of the electrostatic field, simplifying the sample-and-hold requirement. By making use of the voltage to time conversion (or voltage to duty cycle conversion), the method boasts the advantage of high resolution compared with the conventional way of using AD converters. The circuit is fabricated in Chartered 0.35 um technology and is further tested.","PeriodicalId":6415,"journal":{"name":"2007 7th IEEE Conference on Nanotechnology (IEEE NANO)","volume":"75 1","pages":"131-134"},"PeriodicalIF":0.0000,"publicationDate":"2007-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"CMOS digitalized peak detector for a MEMS-based electrostatic field sensor\",\"authors\":\"Guoping Cui, Haigang Yang, S. Xia\",\"doi\":\"10.1109/NANO.2007.4601155\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a new CMOS peak detector that directly converts the peak of a sine wave signal to its digital representation. This peak detector is capable of capturing peak points that carry the information of the electrostatic field, simplifying the sample-and-hold requirement. By making use of the voltage to time conversion (or voltage to duty cycle conversion), the method boasts the advantage of high resolution compared with the conventional way of using AD converters. The circuit is fabricated in Chartered 0.35 um technology and is further tested.\",\"PeriodicalId\":6415,\"journal\":{\"name\":\"2007 7th IEEE Conference on Nanotechnology (IEEE NANO)\",\"volume\":\"75 1\",\"pages\":\"131-134\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 7th IEEE Conference on Nanotechnology (IEEE NANO)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NANO.2007.4601155\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 7th IEEE Conference on Nanotechnology (IEEE NANO)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NANO.2007.4601155","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
CMOS digitalized peak detector for a MEMS-based electrostatic field sensor
This paper presents a new CMOS peak detector that directly converts the peak of a sine wave signal to its digital representation. This peak detector is capable of capturing peak points that carry the information of the electrostatic field, simplifying the sample-and-hold requirement. By making use of the voltage to time conversion (or voltage to duty cycle conversion), the method boasts the advantage of high resolution compared with the conventional way of using AD converters. The circuit is fabricated in Chartered 0.35 um technology and is further tested.