连续注入铯蒸气的负离子源中基于腔衰荡的阴离子密度测量的校正算法

D. Mukhopadhyay, M. Bandyopadhyay
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引用次数: 0

摘要

负离子或原子阴离子密度测量通常是通过在负离子源中使用空腔衰荡光谱(CRDS)诊断系统进行无创测量的。CRDS系统中的光学腔是通过在离子源腔的两个共线相对的端口上安装两个高反射凹面镜来形成的,这样腔就可以将等离子体作为吸收介质包围起来。在连续供气铯离子源中,CRDS镜面暴露于铯蒸气环境中。因此,Cs在镜面上的沉积概率是有限的。此外,离子源工作期间,离子溅射和热畸变会分别降低镜面反射率和镜面对准度。扭曲的空腔排列可能影响CRDS的功能。所有这些问题都增加了镜像损耗,这可能被误解为吸收损耗,并导致对长离子源操作时间的负离子密度的过高估计。CRDS的灵敏度和精度取决于它的镜面反射率,或者更确切地说是“有效反射率”。由于连续Cs沉积会导致镜面反射率的连续变化,因此CRDS的灵敏度和精度也随时间变化。当参考实例与测量实例的时间差较大时,需要一个校正因子来处理负离子密度值的高估。本文提出了一种寻找校正方案的算法。
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Correction algorithm for cavity ring-down based anion density measurement in a negative ion source having continuously fed cesium vapor
Negative ion or atomic anion density measurement is frequently done non-invasively by employing a Cavity Ring-Down Spectroscopy (CRDS) diagnostic system in a negative ion source. The optical cavity in the CRDS system is created by installing two highly reflecting concave mirrors on two collinear opposite ports of the ion source chamber, so that the cavity encloses the plasma as an absorbing medium. In a continuously-fed cesium (Cs)-seeded ion source the CRDS mirror is exposed to Cs vapor environment. As a result, a finite probability of Cs deposition is possible on the mirror surface. In addition, ion sputtering and thermal distortion may degrade the mirror reflectivity and mirror alignment, respectively, during the time of ion source operation. Distorted cavity alignment may affect CRDS functionality. All the above issues increase the mirror loss which can be misinterpreted as absorption losses and lead to an over-estimation of negative ion density for a long ion source operation time. The CRDS sensitivity and accuracy depend on its mirror reflectivity or rather “effective reflectivity”. Since continuous Cs deposition yields a continuous change in mirror reflectivity, the CRDS sensitivity and accuracy also vary in time. A correction factor is needed to take care of the overestimation in negative ion density value if the time difference between the reference instance and measurement instance is significantly large. In this article, an algorithm is presented to find the correction scheme.
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