采用纳米颗粒悬浮液的高分辨率光刻胶宽带抗反射阻光层

IF 1.5 2区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Micro/Nanolithography, MEMS, and MOEMS Pub Date : 2019-02-01 DOI:10.1117/1.JMM.18.1.015501
M. Hamblin, Thane Downing, S. Anderson, H. Schmidt, A. Hawkins
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引用次数: 2

摘要

摘要背景:许多MEMS和光学传感器器件都可以从阻挡透射和抑制可见光反射的层中受益。由于这些设备可以包括复杂的地形,许多现有的沉积抗反射层的方法是困难的,不切实际的,或无法使用。目的:为了制造一种能够与复杂的MEMS和传感器设备很好地工作的阻光抗反射率层,应该制造一种便宜,简单,并且可以在低温下以高分辨率沉积和图案的层。方法:使用铝层实现光阻挡。抑制反射是通过在光刻胶中混合氧化铝纳米粒子来产生部分吸收和部分散射光的层来实现的。结果:一层金属、一层纳米粒子和光刻胶的结合完全阻挡了光的传输,并显著减少了可见光光谱上的反射,尤其是短波长的反射。该层也可图案尺寸小到几微米与高分辨率。结论:通过在光刻胶中结合金属层和纳米颗粒层,可以制备出一种简单、廉价、有效的抗反射层,并与具有复杂形貌的平面器件兼容。
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Broadband antireflective light-blocking layer using nanoparticle suspension in photoresist with high-resolution patterning
Abstract. Background: Many MEMS and optical sensor devices can benefit from layers that block transmission and suppress reflection of light across the visible spectrum. Because these devices can include complicated topography, many existing methods for depositing antireflective layers are difficult, impractical, or unusable. Aim: To create a light-blocking antireflective layer that works well with complicated MEMS and sensor devices, a layer should be made that is cheap, simple, and can be deposited and patterned with high resolution at low temperatures. Approach: Light blocking is achieved using an aluminum layer. Suppressing reflection is achieved by mixing aluminum oxide nanoparticles in photoresist to create a layer that partially absorbs and partially scatters light. Results: The combination of a layer of metal and a layer of nanoparticles and photoresist completely blocks transmission of light and significantly reduces reflections across the visible spectrum, particularly for shorter wavelengths. The layer is also patternable to sizes as small as a few microns with high resolution. Conclusion: By combining a metal layer and a layer of nanoparticles in photoresist, a simple, cheap, and effective light-blocking antireflective layer can be created that is compatible with planar devices with complex topography.
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来源期刊
CiteScore
3.40
自引率
30.40%
发文量
0
审稿时长
6-12 weeks
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