典型封装装配制造的仿真与分析

Y. Liu, S. Irving, D. Desbiens, T. Luk
{"title":"典型封装装配制造的仿真与分析","authors":"Y. Liu, S. Irving, D. Desbiens, T. Luk","doi":"10.1109/ESIME.2006.1643949","DOIUrl":null,"url":null,"abstract":"The manufacturing process for package assembly is a key to assuring the reliability and quality of the semiconductor products. There are a significant number of challenging mechanics problems in assembly manufacturing process that may lead to the failure of die, delamination and package cracking. Identifying potential root causes of quality and reliability problems during the development of an assembly process and during package design is very important; it can reduce scrap during manufacturing, save development time, as well as help insure the product meets the requirements of customers. Simulation can find the root cause quickly and accurately, leading to reduced time and cost. It enables experiments that are too costly to be done by empirical methods. Using simulation we can find the conditions that optimize cost, performance and reliability under different sets of conditions. This paper focuses on modeling and simulation for typical package assembly manufacture processes which have large impact to the product quality and reliability. A finite element framework is developed to simulate the assembly package manufacturing process utilizing the ANSYS software platform. The framework tools are utilized to maximize the robustness of the assembly process in order to eliminate reliability issues, fast run time and minimize costs in development and from manufacturing scrap.","PeriodicalId":60796,"journal":{"name":"微纳电子与智能制造","volume":"33 1","pages":"1-10"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Simulation and analysis for typical package assembly manufacture\",\"authors\":\"Y. Liu, S. Irving, D. Desbiens, T. Luk\",\"doi\":\"10.1109/ESIME.2006.1643949\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The manufacturing process for package assembly is a key to assuring the reliability and quality of the semiconductor products. There are a significant number of challenging mechanics problems in assembly manufacturing process that may lead to the failure of die, delamination and package cracking. Identifying potential root causes of quality and reliability problems during the development of an assembly process and during package design is very important; it can reduce scrap during manufacturing, save development time, as well as help insure the product meets the requirements of customers. Simulation can find the root cause quickly and accurately, leading to reduced time and cost. It enables experiments that are too costly to be done by empirical methods. Using simulation we can find the conditions that optimize cost, performance and reliability under different sets of conditions. This paper focuses on modeling and simulation for typical package assembly manufacture processes which have large impact to the product quality and reliability. A finite element framework is developed to simulate the assembly package manufacturing process utilizing the ANSYS software platform. The framework tools are utilized to maximize the robustness of the assembly process in order to eliminate reliability issues, fast run time and minimize costs in development and from manufacturing scrap.\",\"PeriodicalId\":60796,\"journal\":{\"name\":\"微纳电子与智能制造\",\"volume\":\"33 1\",\"pages\":\"1-10\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-04-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"微纳电子与智能制造\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2006.1643949\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"微纳电子与智能制造","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.1109/ESIME.2006.1643949","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

摘要

封装组装的制造工艺是保证半导体产品可靠性和质量的关键。装配制造过程中存在大量具有挑战性的力学问题,这些问题可能导致模具失效、分层和封装开裂。在组装过程的开发和包装设计过程中,识别质量和可靠性问题的潜在根本原因是非常重要的;它可以减少生产过程中的废料,节省开发时间,确保产品符合客户的要求。仿真可以快速准确地找到问题的根本原因,从而减少时间和成本。它使那些成本太高而无法用经验方法完成的实验成为可能。通过仿真,我们可以找到在不同条件下成本、性能和可靠性最优的条件。针对对产品质量和可靠性影响较大的典型封装装配制造过程进行建模和仿真。利用ANSYS软件平台,建立了模拟装配包制造过程的有限元框架。框架工具用于最大限度地提高装配过程的稳健性,以消除可靠性问题,快速运行时间,最大限度地降低开发成本和制造废料。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Simulation and analysis for typical package assembly manufacture
The manufacturing process for package assembly is a key to assuring the reliability and quality of the semiconductor products. There are a significant number of challenging mechanics problems in assembly manufacturing process that may lead to the failure of die, delamination and package cracking. Identifying potential root causes of quality and reliability problems during the development of an assembly process and during package design is very important; it can reduce scrap during manufacturing, save development time, as well as help insure the product meets the requirements of customers. Simulation can find the root cause quickly and accurately, leading to reduced time and cost. It enables experiments that are too costly to be done by empirical methods. Using simulation we can find the conditions that optimize cost, performance and reliability under different sets of conditions. This paper focuses on modeling and simulation for typical package assembly manufacture processes which have large impact to the product quality and reliability. A finite element framework is developed to simulate the assembly package manufacturing process utilizing the ANSYS software platform. The framework tools are utilized to maximize the robustness of the assembly process in order to eliminate reliability issues, fast run time and minimize costs in development and from manufacturing scrap.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
145
期刊最新文献
Front Matter: Volume 12072 Front Matter: Volume 12073 Multi-Energy Domain Modeling of Microdevices: Virtual Prototyping by Predictive Simulation A Monte Carlo Investigation of Nanocrystal Memory Reliability Difficulties on the estimation of the thermal structure function from noisy thermal impedance transients
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1