{"title":"新的隧道-场效应管结构,具有增强离子和改进的米勒效应,用于节能开关","authors":"A. Biswas, C. Alper, L. De Michielis, A. Ionescu","doi":"10.1109/DRC.2012.6256999","DOIUrl":null,"url":null,"abstract":"Tunneling Field Effect Transistors (TFET) are promising devices to respond to the demanding requirements of future technology nodes. The benefits of the TFETs are linked to their sub-60mV/decade sub-threshold swing, a prerequisite for scaling the supply voltage well below 1V. Main research efforts are currently dedicated to improving the on current (ION) level in a TFET. However, from the circuit point of view the device capacitances are equally important. It is known that the drain-to-gate capacitance in a TFET is almost equal to the gate capacitance in moderate and strong inversion regimes. Due to enhanced Miller Effect, they are known to exhibit large over/undershoot in transient operation as compared to CMOS. Therefore, the effort on improving ION should be simultaneous to an effort of reducing the Miller capacitance (CMILLER). This work proposes a new architecture which addresses both these issues.","PeriodicalId":6808,"journal":{"name":"70th Device Research Conference","volume":"105 1","pages":"131-132"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"New tunnel-FET architecture with enhanced ION and improved Miller Effect for energy efficient switching\",\"authors\":\"A. Biswas, C. Alper, L. De Michielis, A. Ionescu\",\"doi\":\"10.1109/DRC.2012.6256999\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Tunneling Field Effect Transistors (TFET) are promising devices to respond to the demanding requirements of future technology nodes. The benefits of the TFETs are linked to their sub-60mV/decade sub-threshold swing, a prerequisite for scaling the supply voltage well below 1V. Main research efforts are currently dedicated to improving the on current (ION) level in a TFET. However, from the circuit point of view the device capacitances are equally important. It is known that the drain-to-gate capacitance in a TFET is almost equal to the gate capacitance in moderate and strong inversion regimes. Due to enhanced Miller Effect, they are known to exhibit large over/undershoot in transient operation as compared to CMOS. Therefore, the effort on improving ION should be simultaneous to an effort of reducing the Miller capacitance (CMILLER). This work proposes a new architecture which addresses both these issues.\",\"PeriodicalId\":6808,\"journal\":{\"name\":\"70th Device Research Conference\",\"volume\":\"105 1\",\"pages\":\"131-132\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"70th Device Research Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DRC.2012.6256999\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"70th Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2012.6256999","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
摘要
隧道场效应晶体管(ttfet)是一种很有前途的器件,可以响应未来技术节点的苛刻要求。tfet的优势在于其低于60mv / 10的亚阈值摆幅,这是将电源电压降至远低于1V的先决条件。目前主要的研究工作是致力于提高晶体管的on current (ION)水平。然而,从电路的角度来看,器件的电容也同样重要。众所周知,在中等和强反转状态下,TFET的漏极到栅极电容几乎等于栅极电容。由于增强的米勒效应,与CMOS相比,它们在瞬态操作中表现出较大的过冲/欠冲。因此,改善离子的努力应该与降低米勒电容(CMILLER)的努力同时进行。这项工作提出了一个解决这两个问题的新架构。
New tunnel-FET architecture with enhanced ION and improved Miller Effect for energy efficient switching
Tunneling Field Effect Transistors (TFET) are promising devices to respond to the demanding requirements of future technology nodes. The benefits of the TFETs are linked to their sub-60mV/decade sub-threshold swing, a prerequisite for scaling the supply voltage well below 1V. Main research efforts are currently dedicated to improving the on current (ION) level in a TFET. However, from the circuit point of view the device capacitances are equally important. It is known that the drain-to-gate capacitance in a TFET is almost equal to the gate capacitance in moderate and strong inversion regimes. Due to enhanced Miller Effect, they are known to exhibit large over/undershoot in transient operation as compared to CMOS. Therefore, the effort on improving ION should be simultaneous to an effort of reducing the Miller capacitance (CMILLER). This work proposes a new architecture which addresses both these issues.