{"title":"封装InP太阳能电池中光捕获的表面蚀刻","authors":"P. Jenkins, G. Landis","doi":"10.1109/ICIPRM.1991.147319","DOIUrl":null,"url":null,"abstract":"A technique for reducing the reflectance of glass-encapsulated InP, which is important for increasing the efficiency of solar cells and photodetectors, is described. The technique produces low-angle grooves on the surface by a maskless anisotropic etch. Light reflected from the low angle grooves is trapped by total internal reflection at the glass/air interface and directed back to the InP surface. Measurements indicating a significant decrease in surface reflection are presented.<<ETX>>","PeriodicalId":6444,"journal":{"name":"[Proceedings 1991] Third International Conference Indium Phosphide and Related Materials","volume":"110 1","pages":"164-167"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Surface etching for light trapping in encapsulated InP solar cells\",\"authors\":\"P. Jenkins, G. Landis\",\"doi\":\"10.1109/ICIPRM.1991.147319\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A technique for reducing the reflectance of glass-encapsulated InP, which is important for increasing the efficiency of solar cells and photodetectors, is described. The technique produces low-angle grooves on the surface by a maskless anisotropic etch. Light reflected from the low angle grooves is trapped by total internal reflection at the glass/air interface and directed back to the InP surface. Measurements indicating a significant decrease in surface reflection are presented.<<ETX>>\",\"PeriodicalId\":6444,\"journal\":{\"name\":\"[Proceedings 1991] Third International Conference Indium Phosphide and Related Materials\",\"volume\":\"110 1\",\"pages\":\"164-167\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-04-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[Proceedings 1991] Third International Conference Indium Phosphide and Related Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICIPRM.1991.147319\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[Proceedings 1991] Third International Conference Indium Phosphide and Related Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICIPRM.1991.147319","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Surface etching for light trapping in encapsulated InP solar cells
A technique for reducing the reflectance of glass-encapsulated InP, which is important for increasing the efficiency of solar cells and photodetectors, is described. The technique produces low-angle grooves on the surface by a maskless anisotropic etch. Light reflected from the low angle grooves is trapped by total internal reflection at the glass/air interface and directed back to the InP surface. Measurements indicating a significant decrease in surface reflection are presented.<>
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