预镀引线框架上铜线键合的退火效果及结晶特性

B. An, L. Ding, Techun Wang, T. Lu, Yiping Wu
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引用次数: 2

摘要

预镀引线框架(PPF)上的铜线键合是电子封装中一种日益增长的互连方式,在未来几年将取代金线键合在量产中。然而,在将该工艺投入生产之前,应该了解铜线粘合的可靠性。本文研究了直径为50 μm的4N铜线在PPF衬底上的键合。在部分试样中,由于铜的加工硬化效应,铜丝与PPF表面的第2键后跟处的结合强度较低。采用退火工艺修复微观组织缺陷,拉丝试验结果表明,退火工艺显著提高了第二接头的结合强度。界面结晶特征表明,第一键和第二键在热成型和冷成型过程中存在差异。
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Annealing effect and crystallization characteristics of copper wire bonding on pre-plated leadframe
Copper wire bonding on pre-plated leadframe (PPF) is an ever-increasing mode of interconnection in electronic packaging to substitute the gold wire bonding in the volume production in the forthcoming years. Reliability from copper wire bonding should however be well known before putting the process into manufacturing. In this letter, the 4N copper wire with 50 μm diameter bonded on PPF substrate was investigated. It was found for some samples that due to the work hardening effect of the copper, low bonding strength in the heel of the 2nd bond between the copper wire and the PPF surface was noticeable. An anneal process was introduced to recover the microstructural weakness, and wire pull tests revealed that it remarkably enhanced the bond strength of the 2nd joint. Interfacial crystallization characteristics have shown the difference between the 1st and the 2nd bonds which were attributed to hot forming and cold forming respectively.
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