situ探测器用磁控管方法测量硼的等离子体参数

В.И. Гушенец, Александр Степанович Бугаев, А.В. Визирь, Е. М. Окс, А. Г. Николаев, Г.Ю. Юшков
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引用次数: 0

摘要

介绍了探针技术的特点,并给出了平面磁控溅射系统中纯硼靶在镀层沉积过程中产生的等离子体参数的测量结果。探针测量的一个特点是使用加热单个朗缪尔探针的收集面。加热导致硼膜表面电阻降低,使得硼涂层整个过程中磁控管放电等离子体参数的原位探针测量成为可能。
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Зондовое in situ измерение параметров плазмы при нанесении покрытий бора магнетронным методом
The features of the probe technique are described and the results of measuring the parameters of plasma generated by a planar magnetron sputtering system with a pure boron target during coating deposition are presented. A feature of probe measurements was the use of heating the collecting surface of a single Langmuir probe. Heating led to a decrease in the electrical resistance of the boron film on the surface, which made it possible to carry out in situ probe measurements of the magnetron discharge plasma parameters during the entire process of boron coating.
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