S. Maruyama, T. Konishi, K. Machida, N. Ishihara, K. Masu, H. Fujita, H. Toshiyoshi
{"title":"用于MEMS光学扫描仪的时间复用静电驱动和采样接口电路","authors":"S. Maruyama, T. Konishi, K. Machida, N. Ishihara, K. Masu, H. Fujita, H. Toshiyoshi","doi":"10.1109/OMN.2013.6659039","DOIUrl":null,"url":null,"abstract":"We report an interface IC (integrated circuit) to electrostatically drive and measure the tilt-mirror angle by switching the actuator's port to either the driver or charge-sensing circuit in a time-multiplex manner in a period shorter than the mechanical response time to minimize the disturbance of sensing.","PeriodicalId":6334,"journal":{"name":"2013 International Conference on Optical MEMS and Nanophotonics (OMN)","volume":"31 1","pages":"21-22"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A time-multiplexed electrostatic drive and sample interface circuit for MEMS optical scanners\",\"authors\":\"S. Maruyama, T. Konishi, K. Machida, N. Ishihara, K. Masu, H. Fujita, H. Toshiyoshi\",\"doi\":\"10.1109/OMN.2013.6659039\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report an interface IC (integrated circuit) to electrostatically drive and measure the tilt-mirror angle by switching the actuator's port to either the driver or charge-sensing circuit in a time-multiplex manner in a period shorter than the mechanical response time to minimize the disturbance of sensing.\",\"PeriodicalId\":6334,\"journal\":{\"name\":\"2013 International Conference on Optical MEMS and Nanophotonics (OMN)\",\"volume\":\"31 1\",\"pages\":\"21-22\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-11-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 International Conference on Optical MEMS and Nanophotonics (OMN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/OMN.2013.6659039\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 International Conference on Optical MEMS and Nanophotonics (OMN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/OMN.2013.6659039","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A time-multiplexed electrostatic drive and sample interface circuit for MEMS optical scanners
We report an interface IC (integrated circuit) to electrostatically drive and measure the tilt-mirror angle by switching the actuator's port to either the driver or charge-sensing circuit in a time-multiplex manner in a period shorter than the mechanical response time to minimize the disturbance of sensing.