硅衬底上钴的电子束沉积:实验与模拟

IF 1.4 4区 工程技术 Journal of Vacuum Science & Technology B Pub Date : 2021-09-28 DOI:10.1116/6.0001223
P. L’vov, S. V. Bulyarskiy, A. Saurov, V. Svetukhin, A. I. Terentyev
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引用次数: 1

摘要

我们探索了在硅衬底上电子束沉积钴的方法。在不同的电子束功率下对沉积进行了实验研究。用固定热传导方程计算了金属表面的温度分布。所得的薄膜生长速率与电子束功率关系的计算结果与实验数据吻合较好。我们已经证明薄膜的生长速率受到薄膜表面钴原子通量的限制。
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Electron beam deposition of cobalt on the silicon substrate: Experiment and simulation
We explore the electron beam deposition of cobalt on a silicon substrate. The deposition has been studied in experiments at different electron beam powers. The temperature distribution over the metal surface has been calculated using the stationary heat conduction equation for a two-phase system. The obtained calculation results on the dependence of the film growth rate on electron beam power are in good agreement with our experimental data. We have shown that the film growth rate is limited by the flux of cobalt atoms on the film surface.
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来源期刊
Journal of Vacuum Science & Technology B
Journal of Vacuum Science & Technology B 工程技术-工程:电子与电气
自引率
14.30%
发文量
0
审稿时长
2.5 months
期刊介绍: Journal of Vacuum Science & Technology B emphasizes processing, measurement and phenomena associated with micrometer and nanometer structures and devices. Processing may include vacuum processing, plasma processing and microlithography among others, while measurement refers to a wide range of materials and device characterization methods for understanding the physics and chemistry of submicron and nanometer structures and devices.
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