采用薄膜微结构的高性能红外探测器阵列

B. Cole, R. Horning, B. Johnson, K. Nguyen, P. Kruse, M. Foote
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引用次数: 10

摘要

霍尼韦尔开发了一种独特的非制冷热探测器技术,该技术基于用温度敏感探测器材料制造薄膜结构。采用了VOx和YBaCuO等高TCR电阻材料和热释电PbTiO/ sub3 /。尺寸高达240/spl倍/336的二维成像阵列已与Si衬底电子器件集成,在室温下工作,温度灵敏度低于0.04℃。薄膜探测器材料沉积在2mil尺寸的微结构薄膜像素上,随后通过蚀刻除去底层衬底将其与衬底热隔离。显微结构像素的热隔离提供温升,探测器材料提供电信号的转换。
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High performance infrared detector arrays using thin film microstructures
Honeywell has developed a unique uncooled thermal detector technology based on fabricating thin film structures with temperature sensitive detector materials. High TCR resistive materials such as VOx and YBaCuO, and pyroelectric PbTiO/sub 3/ have been used. Two dimensional imaging arrays of sizes up to 240/spl times/336 have been integrated with Si substrate electronics to achieve temperature sensitivities of less than .04 C operating at room temperature. The thin film detector materials are deposited on microstructure thin film pixels of 2 mil sizes which are subsequently thermally isolated from the substrate by etching away the underlying substrate. The thermal isolation of the microstructure pixel provides the temperature rise and the detector material provides the conversion to an electrical signal.
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