{"title":"失效时间分布在老化过程建模中的应用","authors":"R. Włodek","doi":"10.1109/ICHVE.2012.6357089","DOIUrl":null,"url":null,"abstract":"Ageing process of an insulation system appears in the final part of failure rate function v. exploitation time and it influences then the reliability of the device in this time interval of exploitation. Paper presents the different types of the time-to-failure distribution functions and their effects on the failure rate functions.","PeriodicalId":6375,"journal":{"name":"2012 International Conference on High Voltage Engineering and Application","volume":"25 8 1","pages":"532-535"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Application of time-to-failure distributions for the modelling of ageing processes\",\"authors\":\"R. Włodek\",\"doi\":\"10.1109/ICHVE.2012.6357089\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Ageing process of an insulation system appears in the final part of failure rate function v. exploitation time and it influences then the reliability of the device in this time interval of exploitation. Paper presents the different types of the time-to-failure distribution functions and their effects on the failure rate functions.\",\"PeriodicalId\":6375,\"journal\":{\"name\":\"2012 International Conference on High Voltage Engineering and Application\",\"volume\":\"25 8 1\",\"pages\":\"532-535\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 International Conference on High Voltage Engineering and Application\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICHVE.2012.6357089\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 International Conference on High Voltage Engineering and Application","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICHVE.2012.6357089","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Application of time-to-failure distributions for the modelling of ageing processes
Ageing process of an insulation system appears in the final part of failure rate function v. exploitation time and it influences then the reliability of the device in this time interval of exploitation. Paper presents the different types of the time-to-failure distribution functions and their effects on the failure rate functions.
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