S. Bajaj, Ting‐Hsiang Hung, F. Akyol, S. Krishnamoorthy, Sadia Khandaker, A. Armstrong, A. Allerman, S. Rajan
{"title":"基于GaN和AlGaN通道的功率开关晶体管","authors":"S. Bajaj, Ting‐Hsiang Hung, F. Akyol, S. Krishnamoorthy, Sadia Khandaker, A. Armstrong, A. Allerman, S. Rajan","doi":"10.1109/WIPDA.2015.7369292","DOIUrl":null,"url":null,"abstract":"We investigate Al<sub>2</sub>O<sub>3</sub>/AlGaN interface in GaN MOSHEMTs to engineer channel mobility and threshold voltage suitable for power switching applications. Using oxygen-plasma and annealing treatments, we find the optimal window for high mobility and threshold voltage. Next, we discuss the power switching figure of merit of high composition AlGaN based HEMTs and their potential to achieve large threshold voltages. Finally, we characterize the electrical properties of the interface between Al<sub>2</sub>O<sub>3</sub>/high composition Al<sub>0.7</sub>Ga<sub>0.3</sub>N, and measure the conduction band offset of approximately 1 eV with a low positive interface fixed charge density of +2.5 × 10<sup>12</sup> cm<sup>-2</sup>.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"10 1","pages":"16-20"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Power switching transistors based on GaN and AlGaN channels\",\"authors\":\"S. Bajaj, Ting‐Hsiang Hung, F. Akyol, S. Krishnamoorthy, Sadia Khandaker, A. Armstrong, A. Allerman, S. Rajan\",\"doi\":\"10.1109/WIPDA.2015.7369292\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We investigate Al<sub>2</sub>O<sub>3</sub>/AlGaN interface in GaN MOSHEMTs to engineer channel mobility and threshold voltage suitable for power switching applications. Using oxygen-plasma and annealing treatments, we find the optimal window for high mobility and threshold voltage. Next, we discuss the power switching figure of merit of high composition AlGaN based HEMTs and their potential to achieve large threshold voltages. Finally, we characterize the electrical properties of the interface between Al<sub>2</sub>O<sub>3</sub>/high composition Al<sub>0.7</sub>Ga<sub>0.3</sub>N, and measure the conduction band offset of approximately 1 eV with a low positive interface fixed charge density of +2.5 × 10<sup>12</sup> cm<sup>-2</sup>.\",\"PeriodicalId\":6538,\"journal\":{\"name\":\"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)\",\"volume\":\"10 1\",\"pages\":\"16-20\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WIPDA.2015.7369292\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WIPDA.2015.7369292","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Power switching transistors based on GaN and AlGaN channels
We investigate Al2O3/AlGaN interface in GaN MOSHEMTs to engineer channel mobility and threshold voltage suitable for power switching applications. Using oxygen-plasma and annealing treatments, we find the optimal window for high mobility and threshold voltage. Next, we discuss the power switching figure of merit of high composition AlGaN based HEMTs and their potential to achieve large threshold voltages. Finally, we characterize the electrical properties of the interface between Al2O3/high composition Al0.7Ga0.3N, and measure the conduction band offset of approximately 1 eV with a low positive interface fixed charge density of +2.5 × 1012 cm-2.