Cu2ZnSnS4纳米颗粒制备Cu2ZnSn(S,Se)4薄膜

S. Taki, Y. Umejima, A. Uruno, Xianfeng Zhang, M. Kobayashi
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引用次数: 1

摘要

Cu2ZnSn(S,Se)4 (CZTSSe)是一种用Se取代CZTS晶体中部分S的化合物半导体。根据S和Se的摩尔比,带隙在1.05 ~ 1.51 eV之间变化。本文采用硒化法制备了CZTSSe薄膜,并通过改变退火条件来调整Se摩尔比。通过x射线衍射(XRD)和霍尔测量对所制备的CZTSSe薄膜质量进行了表征。结果表明,硒蒸汽压的供给和CZTS的退火温度是薄膜硒化的控制参数。硒蒸汽压的供给也影响了CZTSSe的结晶质量。
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Cu2ZnSn(S,Se)4 thin films prepared using Cu2ZnSnS4 nanoparticles
Cu2ZnSn(S,Se)4 (CZTSSe) is a compound semiconductor which replaces a part of S in the CZTS crystal by Se. The bandgap varies from 1.05 eV to 1.51 eV depending on the mole ratio between S and Se. In this paper, CZTSSe thin films were prepared by the selenidation of CZTS film, and the Se mole ratio was tuned by changing annealing conditions. The film quality of the obtained CZTSSe was characterized by X-ray diffraction (XRD) and Hall measurements. It was revealed that both the supply of Se vapor pressure and the annealing temperature of CZTS were controlling parameters for the selenidation of the film. The crystal quality of CZTSSe was also influenced by the supply of Se vapor pressure.
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