在错误锁存窗口约束下实现软错误最小化的重定时

Yinghai Lu, H. Zhou
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引用次数: 3

摘要

软误差已成为纳米级集成电路中一个重要的可靠性问题,特别是在时序电路中,锁存误差会传播多个周期,并在不同时间影响多个输出。重定时是一种结构操作,它在不改变电路功能的情况下重新定位电路中的寄存器。本文从逻辑屏蔽和时序屏蔽两方面研究了时序重定时对顺序电路软误码率的影响。提出了在误差锁存窗约束下的最小可观察性重定时问题,以降低电路的SER。并提出了一种最优求解该问题的有效算法。实验结果表明,该方法比原始电路平均降低了32.7%,比现有方法提高了15%。
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Retiming for soft error minimization under error-latching window constraints
Soft error has become a critical reliability issue in nanoscale integrated circuits, especially in sequential circuits where a latched error will be propagated for many cycles and affect many outputs at different time. Retiming is a structural operation that relocates registers in a circuit without changing its functionality. In this paper, the effect of retiming on soft error rate (SER) of a sequential circuit is investigated considering both logic masking and timing masking. A minimum observability retiming problem under error-latching window constraints is formulated to reduce the SER of the circuit. And an efficient algorithm is proposed to solve the problem optimally. Experimental results show on average a 32.7% reduction on SER from the original circuits and a 15% improvement over the existing method.
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