{"title":"第22部分概述:千兆赫数据转换器:数据转换器小组委员会","authors":"K. Doris, Jan J. Westra, U. Moon","doi":"10.1109/ISSCC.2018.8310331","DOIUrl":null,"url":null,"abstract":"Extensive calibrations, the use of FinFET technology and architectural innovations continue to push the bandwidth and dynamic range envelopes of high-speed data converters. This session covers gigahertz data converters with resolutions from 8b up to 16b and sampling rates up to 72GS/s.","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"82 1","pages":"356-357"},"PeriodicalIF":0.0000,"publicationDate":"2018-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Session 22 overview: Gigahertz data converters: Data converter subcommittee\",\"authors\":\"K. Doris, Jan J. Westra, U. Moon\",\"doi\":\"10.1109/ISSCC.2018.8310331\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Extensive calibrations, the use of FinFET technology and architectural innovations continue to push the bandwidth and dynamic range envelopes of high-speed data converters. This session covers gigahertz data converters with resolutions from 8b up to 16b and sampling rates up to 72GS/s.\",\"PeriodicalId\":6511,\"journal\":{\"name\":\"2016 IEEE International Solid-State Circuits Conference (ISSCC)\",\"volume\":\"82 1\",\"pages\":\"356-357\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Solid-State Circuits Conference (ISSCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2018.8310331\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2018.8310331","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Session 22 overview: Gigahertz data converters: Data converter subcommittee
Extensive calibrations, the use of FinFET technology and architectural innovations continue to push the bandwidth and dynamic range envelopes of high-speed data converters. This session covers gigahertz data converters with resolutions from 8b up to 16b and sampling rates up to 72GS/s.
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