C. Yuan, G.Q. Zhang, Ching-Shun Huang, Chun-Hui Yu, Chin-Cheng Yang, Wen-Kung Yang, M. Yew, Cheng-Nan Han, K. Chiang
{"title":"WLCSP橡胶焊料(SOR)结构的设计、实验与分析","authors":"C. Yuan, G.Q. Zhang, Ching-Shun Huang, Chun-Hui Yu, Chin-Cheng Yang, Wen-Kung Yang, M. Yew, Cheng-Nan Han, K. Chiang","doi":"10.1109/ESIME.2006.1643969","DOIUrl":null,"url":null,"abstract":"A novel solder on rubber (SOR) structure of the advanced wafer level chip scaled packaging (WLCSP), having the capability of releasing the deformation energy which is caused by the CTE mismatch between the silicon chip and the substrate, is proposed herein. In the SOR structure, a metallic trace and solder pad would be formed on the rubber-based polymer, and a solder is attached onto the said pad. Moreover, a delamination layer is designed and fabricated between the metallic trace and the stress buffer layer (SBL), and the metal trace is also designed as curved shape to prevent the over-stretching of the trace. By the failure of the designed delamination layer, the SOR structure could theoretically release more energy than the conventional WLCSP structure. In this paper, the design concept of the SOR structure, experimental measurement of the adhesion strength of the delamination layer and the finite element (FE) analysis of the SOR structure are discussed","PeriodicalId":60796,"journal":{"name":"微纳电子与智能制造","volume":"42 1","pages":"1-7"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design, Experiment and Analysis of the Solder on Rubber (SOR) structure of WLCSP\",\"authors\":\"C. Yuan, G.Q. Zhang, Ching-Shun Huang, Chun-Hui Yu, Chin-Cheng Yang, Wen-Kung Yang, M. Yew, Cheng-Nan Han, K. Chiang\",\"doi\":\"10.1109/ESIME.2006.1643969\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel solder on rubber (SOR) structure of the advanced wafer level chip scaled packaging (WLCSP), having the capability of releasing the deformation energy which is caused by the CTE mismatch between the silicon chip and the substrate, is proposed herein. In the SOR structure, a metallic trace and solder pad would be formed on the rubber-based polymer, and a solder is attached onto the said pad. Moreover, a delamination layer is designed and fabricated between the metallic trace and the stress buffer layer (SBL), and the metal trace is also designed as curved shape to prevent the over-stretching of the trace. By the failure of the designed delamination layer, the SOR structure could theoretically release more energy than the conventional WLCSP structure. In this paper, the design concept of the SOR structure, experimental measurement of the adhesion strength of the delamination layer and the finite element (FE) analysis of the SOR structure are discussed\",\"PeriodicalId\":60796,\"journal\":{\"name\":\"微纳电子与智能制造\",\"volume\":\"42 1\",\"pages\":\"1-7\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-04-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"微纳电子与智能制造\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2006.1643969\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"微纳电子与智能制造","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.1109/ESIME.2006.1643969","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design, Experiment and Analysis of the Solder on Rubber (SOR) structure of WLCSP
A novel solder on rubber (SOR) structure of the advanced wafer level chip scaled packaging (WLCSP), having the capability of releasing the deformation energy which is caused by the CTE mismatch between the silicon chip and the substrate, is proposed herein. In the SOR structure, a metallic trace and solder pad would be formed on the rubber-based polymer, and a solder is attached onto the said pad. Moreover, a delamination layer is designed and fabricated between the metallic trace and the stress buffer layer (SBL), and the metal trace is also designed as curved shape to prevent the over-stretching of the trace. By the failure of the designed delamination layer, the SOR structure could theoretically release more energy than the conventional WLCSP structure. In this paper, the design concept of the SOR structure, experimental measurement of the adhesion strength of the delamination layer and the finite element (FE) analysis of the SOR structure are discussed