用geant4支持的伽马光谱分析确定发射Ps的绝对分数

Benjamin Rienacker, T. Gigl, G. Nebbia, F. Pino, C. Hugenschmidt
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引用次数: 1

摘要

高温下从锗单晶表面发射的正电子(Ps)分数通常被认为在零正电子注入能量下接近于单位。然而,在实验中,绝对Ps分数的确定并不直接,因为记录具有\SI{100}{\percent} Ps形成的参考光谱仍然是要求很高的。我们使用geant4模拟探测器响应$2\gamma$和$3\gamma$放射源模拟正电子和Ps湮灭在NEPOMUC, FRM II的(巧合)多普勒扩频光谱仪内,为了得到一个可靠的值,从Ge(100)目标加热到其熔点附近重新发射的Ps分数。通过拟合模拟光谱对实测光谱进行分析,结果表明,Ps形成的绝对值为$74\,\SI{+-4}{\percent}$最大值,这与\SI{100}{\percent}-的假设相矛盾。
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Absolute fraction of emitted Ps determined by geant4-supported analysis of gamma spectra
The fraction of positronium (Ps) emitted from a surface of a germanium single crystal at high temperature is usually assumed to approach unity at zero positron implantation energy. In the experiment, however, the determination of the absolute Ps fraction is not straight forward since recording a reference spectrum with \SI{100}{\percent} Ps formation remains demanding. We use GEANT4-simulated detector responses to $2\gamma$- and $3\gamma$ radiation sources mimicking positron and Ps annihilation inside the (coincidence) Doppler-broadening spectrometer at NEPOMUC, FRM II, in order to derive a reliable value for the Ps fraction re-emitted from a Ge(100)-target heated close to its melting point. Analysis of the measured spectra by fitting the simulated spectra shows an absolute value of $74\,\SI{+-4}{\percent}$ maximum Ps formation, contradicting the \SI{100}{\percent}-assumption.
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