M. Nakajima, K. Kuwabara, Takako Ishihara, T. Sakata, M. Usui, N. Nemoto, E. Hashimoto, J. Yamaguchi, S. Uchiyama, Yoshito Jin
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A physical modeling and long-term measurement of tilting angle drift caused by dielectric surface charging in MEMS micromirrors
Dielectric charging of MEMS micromirrors causes tilt angle drift, which is a major reliability problem for telecom applications. In this paper, we propose a physical model of angle drift in a MEMS mirror system considering surface charge motion on dielectric oxide. Good agreement is obtained between the model calculation and experimental results, which suggest that angle drift can be predicted by the proposed model.
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