在中等温度下对SiC(0001)表面进行氢蚀刻

Toshiya Hamasaki, K. Yagyu, H. Mitani, T. Nishida, H. Tochihara, Takayuki Suzuki
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引用次数: 1

摘要

研究了在1200°C的中等温度下,用分子氢气对4H-SiC(0001)表面进行氢蚀刻,以获得足够平坦和清洁的表面,用于大规模高质量的外延石墨烯合成。我们发现,经过长时间的氢蚀刻后,晶圆片在制造过程中产生的微划痕、大凹陷和污染消失了,出现了周期性的原子步骤阵列,保持了初始的平坦表面形态。以1.0 l/min的流速蚀刻1小时是获得平整干净的SiC表面的最佳条件。利用这种表面,我们能够在超高真空中通过热退火合成所谓的零层石墨烯。
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Hydrogen etching of the SiC(0001) surface at moderate temperature
Hydrogen etching of a 4H-SiC(0001) surface at a moderate temperature of 1200 °C with molecular hydrogen gas was investigated to obtain enough flat and clean surface for large-scale high-quality epitaxial graphene synthesis. We found after a prolonged hydrogen etching that micro scratches, large depressions, and contaminations produced on the wafer in the manufacturing process disappeared and that a periodic array of atomic steps appeared, maintaining initial flat surface morphology. One hour of etching with a flow of 1.0 l/min was the optimum condition to obtain a flat and clean SiC surface in the present study. Using such surfaces, we were able to synthesize the so-called zero layer graphene by thermal annealing in ultrahigh vacuum.
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