商用SiC MOSFET功率模块的PSpice模型评估

D. Johannesson, M. Nawaz
{"title":"商用SiC MOSFET功率模块的PSpice模型评估","authors":"D. Johannesson, M. Nawaz","doi":"10.1109/WIPDA.2015.7369257","DOIUrl":null,"url":null,"abstract":"In this paper, a circuit level simulation model for SiC MOSFET power modules has been assessed. The static and dynamic characteristics of a 1.2 kV 800 A SiC MOSFET power module has been measured, simulated and verified in the PSpice circuit simulation platform. The SiC MOSFET power module is evaluated in two case studies, first where the power module is treated as a single device (simulated with one sub-module) and secondly where the performance of the power module is simulated as multiple MOSFET chips in parallel (multiple sub-modules). Here, the bond-wires between the chips are also included as inductive elements. The simulated static characteristics of the SiC MOSFET power module are well aligned with the measured data. In the first case, the simulation model in PSpice shows accurate dynamic performance overall, with exceptions from high-frequency oscillations that arises during turn-on and turn-off. The second case study shows that the oscillations can be captured by introducing multiple MOSFET chips in parallel and where the bond-wires in between are represented by inductors. A slight increase of high-frequency oscillations is noticed but on the cost of reduced simulation robustness (e.g. convergence issues) due to a more complex simulation circuit. Finally, it is concluded that the simulation model performance is overall accurate, both for static and dynamic performance. Further, the model is capable to estimate on-state loss and switching loss in a satisfactory manner and is utilized to evaluate and optimize power electronic converter cell parameters, for instance stray inductance, gate resistance and temperature, and their impact on converter energy loss.","PeriodicalId":6538,"journal":{"name":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","volume":"3 1","pages":"291-295"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Assessment of PSpice model for commercial SiC MOSFET power modules\",\"authors\":\"D. Johannesson, M. Nawaz\",\"doi\":\"10.1109/WIPDA.2015.7369257\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a circuit level simulation model for SiC MOSFET power modules has been assessed. The static and dynamic characteristics of a 1.2 kV 800 A SiC MOSFET power module has been measured, simulated and verified in the PSpice circuit simulation platform. The SiC MOSFET power module is evaluated in two case studies, first where the power module is treated as a single device (simulated with one sub-module) and secondly where the performance of the power module is simulated as multiple MOSFET chips in parallel (multiple sub-modules). Here, the bond-wires between the chips are also included as inductive elements. The simulated static characteristics of the SiC MOSFET power module are well aligned with the measured data. In the first case, the simulation model in PSpice shows accurate dynamic performance overall, with exceptions from high-frequency oscillations that arises during turn-on and turn-off. The second case study shows that the oscillations can be captured by introducing multiple MOSFET chips in parallel and where the bond-wires in between are represented by inductors. A slight increase of high-frequency oscillations is noticed but on the cost of reduced simulation robustness (e.g. convergence issues) due to a more complex simulation circuit. Finally, it is concluded that the simulation model performance is overall accurate, both for static and dynamic performance. Further, the model is capable to estimate on-state loss and switching loss in a satisfactory manner and is utilized to evaluate and optimize power electronic converter cell parameters, for instance stray inductance, gate resistance and temperature, and their impact on converter energy loss.\",\"PeriodicalId\":6538,\"journal\":{\"name\":\"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)\",\"volume\":\"3 1\",\"pages\":\"291-295\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WIPDA.2015.7369257\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE 3rd Workshop on Wide Bandgap Power Devices and Applications (WiPDA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WIPDA.2015.7369257","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

本文对SiC MOSFET功率模块的电路级仿真模型进行了评估。在PSpice电路仿真平台上对一个1.2 kV 800 a SiC MOSFET功率模块的静态和动态特性进行了测量、仿真和验证。SiC MOSFET功率模块在两个案例研究中进行评估,首先将功率模块视为单个器件(用一个子模块模拟),其次将功率模块的性能模拟为并行的多个MOSFET芯片(多个子模块)。在这里,芯片之间的连接线也包括作为感应元件。模拟的SiC MOSFET功率模块的静态特性与实测数据很好地吻合。在第一种情况下,PSpice中的仿真模型总体上显示出准确的动态性能,除了在打开和关断期间产生的高频振荡。第二个案例研究表明,振荡可以通过并行引入多个MOSFET芯片来捕获,其中之间的键合线由电感表示。注意到高频振荡的轻微增加,但由于更复杂的仿真电路,其代价是降低了仿真鲁棒性(例如收敛问题)。最后得出结论,仿真模型的静态和动态性能总体上是准确的。此外,该模型能够较好地估计导通损耗和开关损耗,并用于评估和优化电力电子变换器电池参数,如杂散电感、栅极电阻和温度,以及它们对变换器能量损耗的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Assessment of PSpice model for commercial SiC MOSFET power modules
In this paper, a circuit level simulation model for SiC MOSFET power modules has been assessed. The static and dynamic characteristics of a 1.2 kV 800 A SiC MOSFET power module has been measured, simulated and verified in the PSpice circuit simulation platform. The SiC MOSFET power module is evaluated in two case studies, first where the power module is treated as a single device (simulated with one sub-module) and secondly where the performance of the power module is simulated as multiple MOSFET chips in parallel (multiple sub-modules). Here, the bond-wires between the chips are also included as inductive elements. The simulated static characteristics of the SiC MOSFET power module are well aligned with the measured data. In the first case, the simulation model in PSpice shows accurate dynamic performance overall, with exceptions from high-frequency oscillations that arises during turn-on and turn-off. The second case study shows that the oscillations can be captured by introducing multiple MOSFET chips in parallel and where the bond-wires in between are represented by inductors. A slight increase of high-frequency oscillations is noticed but on the cost of reduced simulation robustness (e.g. convergence issues) due to a more complex simulation circuit. Finally, it is concluded that the simulation model performance is overall accurate, both for static and dynamic performance. Further, the model is capable to estimate on-state loss and switching loss in a satisfactory manner and is utilized to evaluate and optimize power electronic converter cell parameters, for instance stray inductance, gate resistance and temperature, and their impact on converter energy loss.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Recent developments in GaN-based optical rapid switching semiconductor devices Loss analysis of GaN devices in an isolated bidirectional DC-DC converter Monolithic integrated quasi-normally-off gate driver and 600 V GaN-on-Si HEMT A 1 MHz eGaN FET based 4-switch buck-boost converter for automotive applications Reliability and failure physics of GaN HEMT, MIS-HEMT and p-gate HEMTs for power switching applications: Parasitic effects and degradation due to deep level effects and time-dependent breakdown phenomena
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1