Ying Chen, Yibo Lin, Lisong Dong, Tianyang Gai, Rui Chen, Yajuan Su, Yayi Wei, D. Pan
{"title":"SoulNet:利用生成神经网络对先进光刻技术进行超快光源优化","authors":"Ying Chen, Yibo Lin, Lisong Dong, Tianyang Gai, Rui Chen, Yajuan Su, Yayi Wei, D. Pan","doi":"10.1117/1.jmm.18.4.043506","DOIUrl":null,"url":null,"abstract":"Abstract. An optimized source has the ability to improve the process window during lithography in semiconductor manufacturing. Source optimization is always a key technique to improve printing performance. Conventionally, source optimization relies on mathematical–physical model calibration, which is computationally expensive and extremely time-consuming. Machine learning could learn from existing data, construct a prediction model, and speed up the whole process. We propose the first source optimization process based on autoencoder neural networks. The goal of this autoencoder-based process is to increase the speed of the source optimization process with high-quality imaging results. We also make additional technical efforts to improve the performance of our work, including data augmentation and batch normalization. Experimental results demonstrate that our autoencoder-based source optimization achieves about 105 × speed up with 4.67% compromise on depth of focus (DOF), when compared to conventional model-based source optimization method.","PeriodicalId":16522,"journal":{"name":"Journal of Micro/Nanolithography, MEMS, and MOEMS","volume":"37 1","pages":"043506 - 043506"},"PeriodicalIF":1.5000,"publicationDate":"2019-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"SoulNet: ultrafast optical source optimization utilizing generative neural networks for advanced lithography\",\"authors\":\"Ying Chen, Yibo Lin, Lisong Dong, Tianyang Gai, Rui Chen, Yajuan Su, Yayi Wei, D. Pan\",\"doi\":\"10.1117/1.jmm.18.4.043506\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract. An optimized source has the ability to improve the process window during lithography in semiconductor manufacturing. Source optimization is always a key technique to improve printing performance. Conventionally, source optimization relies on mathematical–physical model calibration, which is computationally expensive and extremely time-consuming. Machine learning could learn from existing data, construct a prediction model, and speed up the whole process. We propose the first source optimization process based on autoencoder neural networks. The goal of this autoencoder-based process is to increase the speed of the source optimization process with high-quality imaging results. We also make additional technical efforts to improve the performance of our work, including data augmentation and batch normalization. Experimental results demonstrate that our autoencoder-based source optimization achieves about 105 × speed up with 4.67% compromise on depth of focus (DOF), when compared to conventional model-based source optimization method.\",\"PeriodicalId\":16522,\"journal\":{\"name\":\"Journal of Micro/Nanolithography, MEMS, and MOEMS\",\"volume\":\"37 1\",\"pages\":\"043506 - 043506\"},\"PeriodicalIF\":1.5000,\"publicationDate\":\"2019-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Micro/Nanolithography, MEMS, and MOEMS\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.1117/1.jmm.18.4.043506\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Micro/Nanolithography, MEMS, and MOEMS","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1117/1.jmm.18.4.043506","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Abstract. An optimized source has the ability to improve the process window during lithography in semiconductor manufacturing. Source optimization is always a key technique to improve printing performance. Conventionally, source optimization relies on mathematical–physical model calibration, which is computationally expensive and extremely time-consuming. Machine learning could learn from existing data, construct a prediction model, and speed up the whole process. We propose the first source optimization process based on autoencoder neural networks. The goal of this autoencoder-based process is to increase the speed of the source optimization process with high-quality imaging results. We also make additional technical efforts to improve the performance of our work, including data augmentation and batch normalization. Experimental results demonstrate that our autoencoder-based source optimization achieves about 105 × speed up with 4.67% compromise on depth of focus (DOF), when compared to conventional model-based source optimization method.