金属微结构对肖特基二极管击穿机理的影响

S. Askerov, M. Gasanov, L. KAbdullayeva
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引用次数: 4

摘要

本文研究了金属微观结构对具有肖特基势垒的二极管击穿机理的影响。结果表明,在金属与半导体接触的电子过程中,金属起着非常积极的作用,是比半导体更重要的接触伙伴。与已知的二极管击穿机制(雪崩,隧道和热)不同,本文提出了另一种机制-由具有多晶结构的金属制成的肖特基二极管的反向电流的几何机制。金属的多结晶性使一个均质触点转变为一个复杂的系统,该系统由多个具有不同性质和参数的平行连接的基本触点组成。
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The Influence of the Metal Microstructure on the Breakdown Mechanism of Schottky Diodes
In this paper, the influence of the microstructure of a metal on the breakdown mechanism of diodes with a Schottky barrier is studied. It is shown that in electronic processes occurring in the contact between a metal and a semi-conductor, the metal plays a very active role and is a more important contact partner than a semiconductor. Unlike the known mechanisms of breakdown of diodes (avalanche, tunnel and thermal), another mechanism is proposed in this paper - the geometric mechanism of the reverse current flow of Schottky diodes made using a metal with a poly-crystalline structure. The polycrystallinity of a metal transforms a homogeneous contact into a complex system, which consists of parallel-connected multiple elementary contacts having different properties and parameters.
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