深度学习评估电压跌落有效性

L. Tenti, R. Chiumeo, M. Zanoni, H. Shadmehr
{"title":"深度学习评估电压跌落有效性","authors":"L. Tenti, R. Chiumeo, M. Zanoni, H. Shadmehr","doi":"10.23919/AEIT50178.2020.9241085","DOIUrl":null,"url":null,"abstract":"In this work, a method based on Deep Learning algorithms is applied to assess the validity of voltage dips. The aim is to clean voltage dips statistics from voltage drops due to the measurement transformers saturation, by analyzing their waveforms. In the proposed solution, the signal processing problem addressed is transformed in an image recognition task. The algorithm adopted is based on a convolutional neural network properly trained on a set of images, extracted from the voltage waveforms monitored in the distribution network by the Italian research monitoring system, QuEEN, managed by RSE. The algorithm answer is Boolean: true or false voltage dip, tertium non datur. The obtained results are compared with those usually achieved by a different criterion, based on the detection of a second harmonic component in the measured voltages, already active in both the QuEEN and the Italian national monitoring system. The performances of the two methods in detecting real events with overlapping saturation are compared referring, in particular, to those events for which the traditional method cannot provide an answer (undefined cases). Their pros and cons are then discussed.","PeriodicalId":6689,"journal":{"name":"2020 AEIT International Annual Conference (AEIT)","volume":"132 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Deep Learning to Assess Voltage Dips Validity\",\"authors\":\"L. Tenti, R. Chiumeo, M. Zanoni, H. Shadmehr\",\"doi\":\"10.23919/AEIT50178.2020.9241085\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, a method based on Deep Learning algorithms is applied to assess the validity of voltage dips. The aim is to clean voltage dips statistics from voltage drops due to the measurement transformers saturation, by analyzing their waveforms. In the proposed solution, the signal processing problem addressed is transformed in an image recognition task. The algorithm adopted is based on a convolutional neural network properly trained on a set of images, extracted from the voltage waveforms monitored in the distribution network by the Italian research monitoring system, QuEEN, managed by RSE. The algorithm answer is Boolean: true or false voltage dip, tertium non datur. The obtained results are compared with those usually achieved by a different criterion, based on the detection of a second harmonic component in the measured voltages, already active in both the QuEEN and the Italian national monitoring system. The performances of the two methods in detecting real events with overlapping saturation are compared referring, in particular, to those events for which the traditional method cannot provide an answer (undefined cases). Their pros and cons are then discussed.\",\"PeriodicalId\":6689,\"journal\":{\"name\":\"2020 AEIT International Annual Conference (AEIT)\",\"volume\":\"132 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 AEIT International Annual Conference (AEIT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/AEIT50178.2020.9241085\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 AEIT International Annual Conference (AEIT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/AEIT50178.2020.9241085","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

在这项工作中,一种基于深度学习算法的方法被应用于评估电压下降的有效性。目的是通过分析其波形,从测量变压器饱和引起的电压降中清除电压降统计数据。在该解决方案中,所处理的信号处理问题转化为图像识别任务。采用的算法是基于卷积神经网络对一组图像进行适当训练,这些图像提取自由RSE管理的意大利研究监测系统QuEEN在配电网中监测的电压波形。算法的答案是布尔式的:电压倾斜是真还是假,不确定。将得到的结果与通常通过不同标准获得的结果进行比较,该标准基于在测量电压中检测到的二次谐波成分,已经在女王和意大利国家监测系统中有效。比较了两种方法在检测具有重叠饱和的真实事件时的性能,特别是针对传统方法无法给出答案的事件(未定义情况)。然后讨论它们的利弊。
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Deep Learning to Assess Voltage Dips Validity
In this work, a method based on Deep Learning algorithms is applied to assess the validity of voltage dips. The aim is to clean voltage dips statistics from voltage drops due to the measurement transformers saturation, by analyzing their waveforms. In the proposed solution, the signal processing problem addressed is transformed in an image recognition task. The algorithm adopted is based on a convolutional neural network properly trained on a set of images, extracted from the voltage waveforms monitored in the distribution network by the Italian research monitoring system, QuEEN, managed by RSE. The algorithm answer is Boolean: true or false voltage dip, tertium non datur. The obtained results are compared with those usually achieved by a different criterion, based on the detection of a second harmonic component in the measured voltages, already active in both the QuEEN and the Italian national monitoring system. The performances of the two methods in detecting real events with overlapping saturation are compared referring, in particular, to those events for which the traditional method cannot provide an answer (undefined cases). Their pros and cons are then discussed.
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