{"title":"基于无芯片RFID的微米位移传感器","authors":"E. Perret","doi":"10.1109/MWSYM.2017.8058640","DOIUrl":null,"url":null,"abstract":"In this paper a chipless RFID tag has been used to realized displacement measurements. Displacements of 100 μm can be monitored with this technique coming from chipless RFID. Tagged objects can thus be identified and their displacements can be monitored at the same time with accuracy of a few microns.","PeriodicalId":6481,"journal":{"name":"2017 IEEE MTT-S International Microwave Symposium (IMS)","volume":"12 1","pages":"605-608"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Micrometrie displacement sensor based on chipless RFID\",\"authors\":\"E. Perret\",\"doi\":\"10.1109/MWSYM.2017.8058640\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper a chipless RFID tag has been used to realized displacement measurements. Displacements of 100 μm can be monitored with this technique coming from chipless RFID. Tagged objects can thus be identified and their displacements can be monitored at the same time with accuracy of a few microns.\",\"PeriodicalId\":6481,\"journal\":{\"name\":\"2017 IEEE MTT-S International Microwave Symposium (IMS)\",\"volume\":\"12 1\",\"pages\":\"605-608\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE MTT-S International Microwave Symposium (IMS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.2017.8058640\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE MTT-S International Microwave Symposium (IMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.2017.8058640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Micrometrie displacement sensor based on chipless RFID
In this paper a chipless RFID tag has been used to realized displacement measurements. Displacements of 100 μm can be monitored with this technique coming from chipless RFID. Tagged objects can thus be identified and their displacements can be monitored at the same time with accuracy of a few microns.