{"title":"精密制造光学表面的原位偏转测量","authors":"Zhang Xiangchao, Xu Min","doi":"10.12086/OEE.2020.190581","DOIUrl":null,"url":null,"abstract":"The in-situ measurement of complex optical surfaces is a challenging task in precision engineering. The phase measuring deflectometry is a powerful measuring method for complex specular surfaces, and it has higher measuring efficiency, stability and dynamic range compared to interferometry. Consequently it is promising to widespread applications in various fields. Deflectometry is essentially a calibration problem, and the measuring accuracy is directly determined by the quality of geometrical calibration. An in-situ deflectometric measuring system is designed based on the single point diamond turning machine. A self-calibration method is developed to specify the relative positions of the camera and screen. Ray tracing is conducted at two positions of an auxiliary reflecting mirror, which is mounted on an air bearing spindle. The accuracy of the geometrical positions can be improved by an order of magnitude by minimizing the deviations of the traced points with respect to the true correspondences. According to the statistical properties of the deviations in reverse ray tracing, the form errors and the position errors can be separated, and the positioning error of the workpiece can be corrected accordingly. Henceforth, the nominal shape of the fabricated workpiece can be fully utilized, and the conventional one-way position-form mapping can be converted into a two-way mapping problem. As for the complex shapes, the whole surface can be covered by sub-aperture measurement. Precise localization of a local region under test is achieved by multi-position imaging, so that correct convergence of the iterative reconstruction process can be guaranteed. Several typical optical surfaces including an off-axis paraboloid mirror are measured, and the measuring accuracy of the proposed method is proved better than 150 nm RMS.","PeriodicalId":39552,"journal":{"name":"光电工程","volume":"55 1","pages":"190581"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"In-situ deflectometric measurement of optical surfaces for precision manufacturing\",\"authors\":\"Zhang Xiangchao, Xu Min\",\"doi\":\"10.12086/OEE.2020.190581\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The in-situ measurement of complex optical surfaces is a challenging task in precision engineering. The phase measuring deflectometry is a powerful measuring method for complex specular surfaces, and it has higher measuring efficiency, stability and dynamic range compared to interferometry. Consequently it is promising to widespread applications in various fields. Deflectometry is essentially a calibration problem, and the measuring accuracy is directly determined by the quality of geometrical calibration. An in-situ deflectometric measuring system is designed based on the single point diamond turning machine. A self-calibration method is developed to specify the relative positions of the camera and screen. Ray tracing is conducted at two positions of an auxiliary reflecting mirror, which is mounted on an air bearing spindle. The accuracy of the geometrical positions can be improved by an order of magnitude by minimizing the deviations of the traced points with respect to the true correspondences. According to the statistical properties of the deviations in reverse ray tracing, the form errors and the position errors can be separated, and the positioning error of the workpiece can be corrected accordingly. Henceforth, the nominal shape of the fabricated workpiece can be fully utilized, and the conventional one-way position-form mapping can be converted into a two-way mapping problem. As for the complex shapes, the whole surface can be covered by sub-aperture measurement. Precise localization of a local region under test is achieved by multi-position imaging, so that correct convergence of the iterative reconstruction process can be guaranteed. Several typical optical surfaces including an off-axis paraboloid mirror are measured, and the measuring accuracy of the proposed method is proved better than 150 nm RMS.\",\"PeriodicalId\":39552,\"journal\":{\"name\":\"光电工程\",\"volume\":\"55 1\",\"pages\":\"190581\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"光电工程\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.12086/OEE.2020.190581\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"光电工程","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.12086/OEE.2020.190581","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
In-situ deflectometric measurement of optical surfaces for precision manufacturing
The in-situ measurement of complex optical surfaces is a challenging task in precision engineering. The phase measuring deflectometry is a powerful measuring method for complex specular surfaces, and it has higher measuring efficiency, stability and dynamic range compared to interferometry. Consequently it is promising to widespread applications in various fields. Deflectometry is essentially a calibration problem, and the measuring accuracy is directly determined by the quality of geometrical calibration. An in-situ deflectometric measuring system is designed based on the single point diamond turning machine. A self-calibration method is developed to specify the relative positions of the camera and screen. Ray tracing is conducted at two positions of an auxiliary reflecting mirror, which is mounted on an air bearing spindle. The accuracy of the geometrical positions can be improved by an order of magnitude by minimizing the deviations of the traced points with respect to the true correspondences. According to the statistical properties of the deviations in reverse ray tracing, the form errors and the position errors can be separated, and the positioning error of the workpiece can be corrected accordingly. Henceforth, the nominal shape of the fabricated workpiece can be fully utilized, and the conventional one-way position-form mapping can be converted into a two-way mapping problem. As for the complex shapes, the whole surface can be covered by sub-aperture measurement. Precise localization of a local region under test is achieved by multi-position imaging, so that correct convergence of the iterative reconstruction process can be guaranteed. Several typical optical surfaces including an off-axis paraboloid mirror are measured, and the measuring accuracy of the proposed method is proved better than 150 nm RMS.
光电工程Engineering-Electrical and Electronic Engineering
CiteScore
2.00
自引率
0.00%
发文量
6622
期刊介绍:
Founded in 1974, Opto-Electronic Engineering is an academic journal under the supervision of the Chinese Academy of Sciences and co-sponsored by the Institute of Optoelectronic Technology of the Chinese Academy of Sciences (IOTC) and the Optical Society of China (OSC). It is a core journal in Chinese and a core journal in Chinese science and technology, and it is included in domestic and international databases, such as Scopus, CA, CSCD, CNKI, and Wanfang.
Opto-Electronic Engineering is a peer-reviewed journal with subject areas including not only the basic disciplines of optics and electricity, but also engineering research and engineering applications. Optoelectronic Engineering mainly publishes scientific research progress, original results and reviews in the field of optoelectronics, and publishes related topics for hot issues and frontier subjects.
The main directions of the journal include:
- Optical design and optical engineering
- Photovoltaic technology and applications
- Lasers, optical fibres and communications
- Optical materials and photonic devices
- Optical Signal Processing