开明的调试

Xiangyu Li, Shaowei Zhu, Marcelo d’Amorim, A. Orso
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引用次数: 32

摘要

已经提出了许多自动化技术来减少软件调试的成本,这是一项众所周知的耗时和人力密集的活动。在这些技术中,统计故障定位(SFL)尤为流行。SFL的一个问题是,它基于对开发人员在调试时的行为的强烈的、通常是不切实际的假设。为了解决这个问题,我们提出了一种交互式的、反馈驱动的故障定位技术。给定一个失败的测试,启蒙(1)利用SFL和动态依赖分析来识别可疑的方法调用和相应的数据值,(2)向开发人员提供关于以输入和输出表示的最可疑调用的查询,(3)将开发人员对单个数据值正确性的反馈编码为额外的程序规范,(4)重复这些步骤,直到发现故障。我们从两个方面评估了enlightenment。首先,我们使用自动化oracle作为模拟用户,将enlightenment应用于3个开源程序中的1,807个真实和种子故障;对于超过96%的故障,启蒙需要与模拟用户进行不到10次交互来定位故障,并且灵敏度分析表明结果对错误响应具有鲁棒性。其次,我们对24名参与者进行了4个故障的实际用户研究,发现使用启蒙工具的参与者在故障定位数量和故障定位所需时间方面的表现明显优于未使用我们工具的参与者。
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Enlightened Debugging
Numerous automated techniques have been proposed to reduce the cost of software debugging, a notoriously time-consuming and human-intensive activity. Among these techniques, Statistical Fault Localization (SFL) is particularly popular. One issue with SFL is that it is based on strong, often unrealistic assumptions on how developers behave when debugging. To address this problem, we propose Enlighten, an interactive, feedback-driven fault localization technique. Given a failing test, Enlighten (1) leverages SFL and dynamic dependence analysis to identify suspicious method invocations and corresponding data values, (2) presents the developer with a query about the most suspicious invocation expressed in terms of inputs and outputs, (3) encodes the developer feedback on the correctness of individual data values as extra program specifications, and (4) repeats these steps until the fault is found. We evaluated Enlighten in two ways. First, we applied Enlighten to 1,807 real and seeded faults in 3 open source programs using an automated oracle as a simulated user; for over 96% of these faults, Enlighten required less than 10 interactions with the simulated user to localize the fault, and a sensitivity analysis showed that the results were robust to erroneous responses. Second, we performed an actual user study on 4 faults with 24 participants and found that participants who used Enlighten performed significantly better than those not using our tool, in terms of both number of faults localized and time needed to localize the faults.
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