针对8MB/s高性能TLC NAND闪存,提出一种基于slc到TLC迁移的3位新编程算法

Seung-Hwan Shin, Dong-Kyo Shim, Jaeyong Jeong, O. Kwon, Sangyong Yoon, Myung-Hoon Choi, Tae-Young Kim, H. Park, Hyun-Jun Yoon, Youngsun Song, Yoon-Hee Choi, Sang-Won Shim, Yang-Lo Ahn, Ki-Tae Park, Jin-Man Han, K. Kyung, Young-Hyun Jun
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引用次数: 40

摘要

我们开发了一种新的用于20nm及以上节点的高性能TLC(triple -level cell, 3-bit/cell) NAND闪存的3位编程算法。采用基于slc到tlc迁移的3位重编程算法,性能和误码率分别比传统方法提高50%和68%。该算法已成功实现在21nm 64Gb TLC NAND闪存产品上,该产品具有8MB/s的写入吞吐量和400MB/s的读取吞吐量。
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A new 3-bit programming algorithm using SLC-to-TLC migration for 8MB/s high performance TLC NAND flash memory
We have developed a new 3-bit programming algorithm of high performance TLC(Triple-level-cell, 3-bit/cell) NAND flash memories for 20nm node and beyond. By using the proposed 3-bit algorithm based on reprogramming with SLC-to-TLC migration, performance and BER is improved by 50% and 68%, respectively, compared to conventional method. The proposed algorithm is successfully implemented in 21nm 64Gb TLC NAND flash product that provides 8MB/s write and 400MB/s read throughputs.
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