PECVD晶圆制造设备中消除He作为晶圆冷却气体

Gerald J. Brady, Jon David Sumega, Terry Powell, Eric Madsen
{"title":"PECVD晶圆制造设备中消除He作为晶圆冷却气体","authors":"Gerald J. Brady, Jon David Sumega, Terry Powell, Eric Madsen","doi":"10.1109/ASMC49169.2020.9185312","DOIUrl":null,"url":null,"abstract":"In the proposed study we demonstrate the elimination of helium as a wafer cooling gas in plasma enhanced chemical vapor deposition (PECVD) wafer fabrication equipment (WFE). Key technical challenges were addressed by using proprietary helium elimination hardware and software. The helium elimination upgrade proved to be compatible over a wide array of applications after testing multiple PECVD processes without any observed negative impact to process performance or throughput. By incorporating this technology in Lam’s VECTOR® system, end users can expect to save approximately 5L of He per wafer processed, resulting in substantial savings in the overall cost of manufacturing integrated circuits (ICs).","PeriodicalId":6771,"journal":{"name":"2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","volume":"5 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2020-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Eliminating He as Wafer Cooling Gas in PECVD Wafer Fabrication Equipment\",\"authors\":\"Gerald J. Brady, Jon David Sumega, Terry Powell, Eric Madsen\",\"doi\":\"10.1109/ASMC49169.2020.9185312\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the proposed study we demonstrate the elimination of helium as a wafer cooling gas in plasma enhanced chemical vapor deposition (PECVD) wafer fabrication equipment (WFE). Key technical challenges were addressed by using proprietary helium elimination hardware and software. The helium elimination upgrade proved to be compatible over a wide array of applications after testing multiple PECVD processes without any observed negative impact to process performance or throughput. By incorporating this technology in Lam’s VECTOR® system, end users can expect to save approximately 5L of He per wafer processed, resulting in substantial savings in the overall cost of manufacturing integrated circuits (ICs).\",\"PeriodicalId\":6771,\"journal\":{\"name\":\"2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)\",\"volume\":\"5 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASMC49169.2020.9185312\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC49169.2020.9185312","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

在我们提出的研究中,我们展示了在等离子体增强化学气相沉积(PECVD)晶圆制造设备(WFE)中消除氦作为晶圆冷却气体。采用专有的氦消除硬件和软件解决了关键技术难题。在测试了多个PECVD工艺后,证明了氦气消除升级在广泛的应用中是兼容的,没有观察到任何对工艺性能或吞吐量的负面影响。通过将这项技术整合到Lam的VECTOR®系统中,最终用户可以期望每处理一片晶圆节省大约5L的He,从而大大节省制造集成电路(ic)的总体成本。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Eliminating He as Wafer Cooling Gas in PECVD Wafer Fabrication Equipment
In the proposed study we demonstrate the elimination of helium as a wafer cooling gas in plasma enhanced chemical vapor deposition (PECVD) wafer fabrication equipment (WFE). Key technical challenges were addressed by using proprietary helium elimination hardware and software. The helium elimination upgrade proved to be compatible over a wide array of applications after testing multiple PECVD processes without any observed negative impact to process performance or throughput. By incorporating this technology in Lam’s VECTOR® system, end users can expect to save approximately 5L of He per wafer processed, resulting in substantial savings in the overall cost of manufacturing integrated circuits (ICs).
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Systematic Missing Pattern Defects Introduced by Topcoat Change at PC Lithography: A Case Study in the Tandem Usage of Inspection Methods Computational Process Control Compatible Dimensional Metrology Tool: Through-focus Scanning Optical Microscopy Characterization of Sub-micron Metal Line Arrays Using Picosecond Ultrasonics An Artificial Neural Network Based Algorithm For Real Time Dispatching Decisions A Framework for Semi-Automated Fault Detection Configuration with Automated Feature Extraction and Limits Setting
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1