{"title":"开尔文力显微镜(KFM)研究铌酸锶钡(SBN)外延薄膜的局部极化","authors":"M. Cuniot-Ponsard","doi":"10.1109/ISAF.2012.6297795","DOIUrl":null,"url":null,"abstract":"The Kelvin Force Microscopy technique is exploited to obtain quantitative information on the local polarization dependences in strontium barium niobate epitaxial thin films.","PeriodicalId":20497,"journal":{"name":"Proceedings of ISAF-ECAPD-PFM 2012","volume":"35 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2012-07-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Local polarization in strontium barium niobate (SBN) epitaxial thin films investigated using Kelvin Force Microscopy (KFM)\",\"authors\":\"M. Cuniot-Ponsard\",\"doi\":\"10.1109/ISAF.2012.6297795\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Kelvin Force Microscopy technique is exploited to obtain quantitative information on the local polarization dependences in strontium barium niobate epitaxial thin films.\",\"PeriodicalId\":20497,\"journal\":{\"name\":\"Proceedings of ISAF-ECAPD-PFM 2012\",\"volume\":\"35 1\",\"pages\":\"1-3\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-07-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of ISAF-ECAPD-PFM 2012\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAF.2012.6297795\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of ISAF-ECAPD-PFM 2012","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAF.2012.6297795","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Local polarization in strontium barium niobate (SBN) epitaxial thin films investigated using Kelvin Force Microscopy (KFM)
The Kelvin Force Microscopy technique is exploited to obtain quantitative information on the local polarization dependences in strontium barium niobate epitaxial thin films.
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