{"title":"第24场概述:GaN驱动和转换器:电源管理小组委员会","authors":"Y. Ramadass, Gerard Villar Pique, A. Thomsen","doi":"10.1109/ISSCC.2018.8310343","DOIUrl":null,"url":null,"abstract":"GaN power devices have garnered significant attention for their reduced switching losses leading to small-form-factor high-frequency switching converters. However, issues related to reliable GaN gate drivers, level shifters with high common-mode immunity and zero-voltage switching detection remain. This session presents recent advances in gate drivers and ZVS detection schemes for GaNbased power converters.","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"6 1","pages":"380-381"},"PeriodicalIF":0.0000,"publicationDate":"2018-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Session 24 overview: GaN drivers and converters: Power management subcommittee\",\"authors\":\"Y. Ramadass, Gerard Villar Pique, A. Thomsen\",\"doi\":\"10.1109/ISSCC.2018.8310343\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"GaN power devices have garnered significant attention for their reduced switching losses leading to small-form-factor high-frequency switching converters. However, issues related to reliable GaN gate drivers, level shifters with high common-mode immunity and zero-voltage switching detection remain. This session presents recent advances in gate drivers and ZVS detection schemes for GaNbased power converters.\",\"PeriodicalId\":6511,\"journal\":{\"name\":\"2016 IEEE International Solid-State Circuits Conference (ISSCC)\",\"volume\":\"6 1\",\"pages\":\"380-381\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Solid-State Circuits Conference (ISSCC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2018.8310343\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2018.8310343","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Session 24 overview: GaN drivers and converters: Power management subcommittee
GaN power devices have garnered significant attention for their reduced switching losses leading to small-form-factor high-frequency switching converters. However, issues related to reliable GaN gate drivers, level shifters with high common-mode immunity and zero-voltage switching detection remain. This session presents recent advances in gate drivers and ZVS detection schemes for GaNbased power converters.