2015 IEEE International Integrated Reliability Workshop (IIRW)

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Hot Carrier Stress modeling: From degradation kinetics to trap distribution evolution

Pub Date : 2015-10-01 DOI: 10.1109/IIRW.2015.7437086 G. Torrente, X. Federspiel, D. Rideau, F. Monsieur, C. Tavernier, J. Coignus, D. Roy, G. Ghibaudo

Radiation testing of tantalum oxide-based resistive memory

Pub Date : 2015-10-01 DOI: 10.1109/IIRW.2015.7437091 J. Holt, N. Cady, J. Yang-Scharlotta

Charge-based stochastic aging analysis of CMOS circuits

Pub Date : 2015-10-01 DOI: 10.1109/IIRW.2015.7437084 Theodor Hillebrand, Nico Hellwege, N. Heidmann, S. Paul, D. Peters-Drolshagen

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