Research on Over-Temperature using of PEM Evaluation Method in Military

Abstract

In order to evaluate the reliability of over-temperature using of Plastic Encapsulated Microcircuit (PEM) in military, this paper designs tests to simulate environmental suitability and lifetime by analyzing the failure mode and mechanism of PEM (the plastic encapsulated microcircuit). Based on the analysis, the evaluating tests are designed and conducted, and the result shows that HAST (High accelerated stress temperature), temperature cycling, and Steady state life test under the operating condition but within the maximum temperature limit, can be chosen to evaluate the reliability of the devices used over-temperature in sequence. This provides a set of feasible evaluation methods for the over-temperature using of PEM, which can effectively guarantee the quality and reliability of PEM, also provides theoretical basis for the subsequent formation of effective evaluation methods and standards for the screening and detection of the overtemperature using of PEM.