A circuit design for 2 Gbit/s Si brpolar crosspoint switch LSIs

M. Suzuki, N. Yamanaka, M. Hirata, S. Kikuchi
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引用次数: 5

Abstract

A Si bipolar circuit design technology for gigabit-per-second crosspoint switch LSI's is described. An 8X 8 and an expandable 16X 16 crosspoint switch LSI have been developed utilizing a new circuit design and super self-aligned process technology (SST-1A). The LSI's success- fully switched with a bit error rate of less than at 2.5 Gbit/s using a Z9 - 1 pseudorandom NRZ sequence. Pulse jitter has been limited to less than 80 ps at 1.2 Gbit/s by utilizing a small internal voltage swing (225 mV) employing a differential CML cell, including a selector. The LSI's have an ECL-compatible interface, -4- and - 2-V power supply voltages, and a power dissipation of less than 0.9 W for the 8 X 8 LSI and 2.8 W for the expandable 16~ 16 LSI.
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一种2gbit /s Si双极性交点开关lsi电路设计
介绍了一种用于千兆位/秒交点开关LSI的硅双极电路设计技术。利用新的电路设计和超自对准工艺技术(SST-1A)开发了8x8和可扩展16x16交叉点开关LSI。该LSI使用Z9 - 1伪随机NRZ序列,以低于2.5 Gbit/s的误码率成功切换。脉冲抖动已被限制在小于80 ps的1.2 Gbit/s通过利用一个小的内部电压摆幅(225 mV)采用差分CML单元,包括一个选择器。LSI的接口兼容ecl,供电电压为- 4v和- 2v, 8 × 8 LSI的功耗小于0.9 W,可扩展16~ 16 LSI的功耗小于2.8 W。
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A circuit design for 2 Gbit/s Si brpolar crosspoint switch LSIs Mappable memory subsystem for high speed applications A 36μa 4MB PSRAM with quadruple array operation High reliability CMOS SRAM with built-in soft defect detection "A 1.6ns 64kb ECL RAM with 1K gate logic"
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