Built-in Self Testing of a DRP-Based GSM Transmitter

Abstract

We present a novel approach for built-in self-testing (BIST) of an RF wireless transmitter. This approach, based on fully-digital hardware and on software algorithms, allows the testing of the transmitter's analog/RF circuitry while providing low-cost replacements for the costly traditional RF tests. The testing approach is structural in nature and substitutes for the commonly employed RF performance testing of high-cost test equipment and extended test times. The test coverage achieved for the analog circuitry is maximized to approach 100% and the test-time and associated test costs are minimized. The presented techniques have been successfully verified in a commercial 90 nm CMOS single-chip GSM radio based on the Digital RF Processor (DRPtrade) technology.