{"title":"Extraction of jitter parameters from BER measurements","authors":"M. Aleksic","doi":"10.1109/EPEPS.2011.6100187","DOIUrl":null,"url":null,"abstract":"This paper presents a method for jitter parameter extraction from bit error rate measurements, that can be used as an alternative to the dual-Dirac method. The method offers more accurate estimates of random and deterministic jitter, at the expense of a slight increase in complexity. The model underlying the method can be used for extrapolation of bit error rate to the values that are impractical to measure.","PeriodicalId":313560,"journal":{"name":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","volume":"79 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2011.6100187","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
This paper presents a method for jitter parameter extraction from bit error rate measurements, that can be used as an alternative to the dual-Dirac method. The method offers more accurate estimates of random and deterministic jitter, at the expense of a slight increase in complexity. The model underlying the method can be used for extrapolation of bit error rate to the values that are impractical to measure.
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