FzCRITIC-a functional timing verifier using a novel fuzzy delay model

Rathish Jayabharathi, M. d'Abreu, J. Abraham
{"title":"FzCRITIC-a functional timing verifier using a novel fuzzy delay model","authors":"Rathish Jayabharathi, M. d'Abreu, J. Abraham","doi":"10.1109/ICVD.1999.745153","DOIUrl":null,"url":null,"abstract":"Chip performance and density are increasing tremendously and the CAD tools are always lagging behind. In this paper, we introduce a functional timing verifier using a novel fuzzy delay model which bridges the gap between the front-end timing verification and the back-end delay fault testing. The proposed fuzzy delay model can handle uncertainties with respect to timing characteristics, and manufacturing anomalies. Experimental results are presented for the ISCAS-85 benchmark circuits.","PeriodicalId":443373,"journal":{"name":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1999.745153","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Chip performance and density are increasing tremendously and the CAD tools are always lagging behind. In this paper, we introduce a functional timing verifier using a novel fuzzy delay model which bridges the gap between the front-end timing verification and the back-end delay fault testing. The proposed fuzzy delay model can handle uncertainties with respect to timing characteristics, and manufacturing anomalies. Experimental results are presented for the ISCAS-85 benchmark circuits.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
fzcritical -一种基于新型模糊延迟模型的功能时序验证器
芯片的性能和密度都在不断提高,而CAD工具却一直落后。本文介绍了一种基于模糊延迟模型的功能定时验证器,该模型将前端定时验证与后端延迟故障测试相结合。所提出的模糊延迟模型可以处理与时序特性和制造异常有关的不确定性。给出了ISCAS-85基准电路的实验结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Improved effective capacitance computations for use in logic and layout optimization Assignment and reordering of incompletely specified pattern sequences targetting minimum power dissipation FzCRITIC-a functional timing verifier using a novel fuzzy delay model Verifying Tomasulo's algorithm by refinement Superscalar processor validation at the microarchitecture level
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1