{"title":"Multi-channel and High-precision Parallel Transient Interruption Test Technology","authors":"Dong Bigui, Liang Xu, Yan Deshun","doi":"10.1109/IMCCC.2011.42","DOIUrl":null,"url":null,"abstract":"Transient interruption is a common failure phenomenon which is the key factor influencing the contact reliability of connectors. This paper analyzes the failure process and characteristics of transient interruption, and presents a multi-channel and high precision parallel test technology. The transient interruption test system designed in the paper can effectively realize the detection of transient interruption and has been applied to the practical project.","PeriodicalId":446508,"journal":{"name":"2011 First International Conference on Instrumentation, Measurement, Computer, Communication and Control","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 First International Conference on Instrumentation, Measurement, Computer, Communication and Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMCCC.2011.42","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Transient interruption is a common failure phenomenon which is the key factor influencing the contact reliability of connectors. This paper analyzes the failure process and characteristics of transient interruption, and presents a multi-channel and high precision parallel test technology. The transient interruption test system designed in the paper can effectively realize the detection of transient interruption and has been applied to the practical project.
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