{"title":"DELPHI-a status report on the European-funded project for the development of libraries and physical models for an integrated design environment","authors":"H. Rosten","doi":"10.1109/ECTC.1996.517390","DOIUrl":null,"url":null,"abstract":"The accurate prediction of the operating temperatures of critical electronic parts at the component-, board- and system-level is seriously hampered by the lack of reliable, standardised input data. This paper reports an the status of work-in-progress in the 3-year European collaborative project, named DELPHI, whose goal is to solve the aforementioned problem. The project concerns the creation and experimental validation of thermal models (detailed and compact) of a range of electronic parts including mono-chip packages, heat sinks, electrolytic capacitors, transformers and interfacing materials. The purpose of this paper is to give an account of the principal project results. A bibliography of published DELPHI technical papers is provided.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.517390","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18
Abstract
The accurate prediction of the operating temperatures of critical electronic parts at the component-, board- and system-level is seriously hampered by the lack of reliable, standardised input data. This paper reports an the status of work-in-progress in the 3-year European collaborative project, named DELPHI, whose goal is to solve the aforementioned problem. The project concerns the creation and experimental validation of thermal models (detailed and compact) of a range of electronic parts including mono-chip packages, heat sinks, electrolytic capacitors, transformers and interfacing materials. The purpose of this paper is to give an account of the principal project results. A bibliography of published DELPHI technical papers is provided.