A. Ramanujan, E. Sicard, A. Boyer, J. Levant, C. Marot, F. Lafon
{"title":"Developing a universal exchange format for Integrated Circuit Emission Model - Conducted Emissions","authors":"A. Ramanujan, E. Sicard, A. Boyer, J. Levant, C. Marot, F. Lafon","doi":"10.1109/EMCCOMPO.2015.7358367","DOIUrl":null,"url":null,"abstract":"A new international standard proposal (IEC 62433-2 Edition 2.0) is in progress. The main purpose of the standard is to provide an Integrated Circuit Emission Model - Conducted Emission (ICEM-CE) along with a data exchange format. It is known that the existing ICEM-CE information is closely linked to the supplier of the model or simulation software used to generate the model information, rendering extremely difficult its exchange between suppliers, customers, EDA tool vendors, academics, etc. This paper describes a universal exchange format for ICEM-CE. The format is based on the well-known eXtensible Markup Language format, which is both machine and human readable. As an illustrative example, it is applied on an Atmega88 microcontroller: the model is extracted by the manufacturer, Atmel, and is exchanged with an academic partner, INSA, and an industrial partner, Valeo. The exchange proves fruitful and the model was easily deployable to predict conducted emission noise.","PeriodicalId":236992,"journal":{"name":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2015.7358367","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A new international standard proposal (IEC 62433-2 Edition 2.0) is in progress. The main purpose of the standard is to provide an Integrated Circuit Emission Model - Conducted Emission (ICEM-CE) along with a data exchange format. It is known that the existing ICEM-CE information is closely linked to the supplier of the model or simulation software used to generate the model information, rendering extremely difficult its exchange between suppliers, customers, EDA tool vendors, academics, etc. This paper describes a universal exchange format for ICEM-CE. The format is based on the well-known eXtensible Markup Language format, which is both machine and human readable. As an illustrative example, it is applied on an Atmega88 microcontroller: the model is extracted by the manufacturer, Atmel, and is exchanged with an academic partner, INSA, and an industrial partner, Valeo. The exchange proves fruitful and the model was easily deployable to predict conducted emission noise.