D. Hiemstra, C. Jin, Z. Li, R. Chen, S. Shi, L. Chen
{"title":"Single Event Effect Evaluation of the Jetson AGX Xavier Module Using Proton Irradiation","authors":"D. Hiemstra, C. Jin, Z. Li, R. Chen, S. Shi, L. Chen","doi":"10.1109/REDW51883.2020.9325840","DOIUrl":null,"url":null,"abstract":"The Single Event Effect (SEE) cross-sections for various operating modes of a Jetson AGX Xavier GPU module were evaluated using proton irradiation. The results show that the error rate can be reduced with redundancy techniques.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325840","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The Single Event Effect (SEE) cross-sections for various operating modes of a Jetson AGX Xavier GPU module were evaluated using proton irradiation. The results show that the error rate can be reduced with redundancy techniques.
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