SEL and TID Characterization of a Cobham Advanced Electronic Solutions SONOS Nonvolatile Memory

M. Von Thun, D. Bass, Radu Dumitru, Rex Anderson, Jack Benthem, Shaw Ashenafi
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Abstract

A Cobham Advanced Electronic Solutions SONOS based Nor Flash non-volatile memory has been designed, manufactured, and characterized for radiation effects. The radiation effects results will be presented.
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Cobham先进电子解决方案SONOS非易失性存储器的SEL和TID表征
Cobham Advanced Electronic Solutions基于SONOS的Nor Flash非易失性存储器已被设计、制造并表征为辐射效应。将介绍辐射效应的结果。
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