{"title":"Recent Single Event Transients, Upsets, and Latchup Test Results for TPS3307-18, TL1431, INA129, AM26LV31 & 32 Electronic Parts","authors":"J. Hatch, Brittany Butterworth","doi":"10.1109/REDW51883.2020.9325851","DOIUrl":null,"url":null,"abstract":"Automotive grade parts provide a commercial \"off-the-shelf\" (COTS) active electronic part alternative for application in satellite and launch vehicles. The results of heavy ion induced Single Event Effects (SEE) measured in various automotive parts are put forth for examination. Automotive grade parts provide additional challenge for die / wafer traceability in the fabrication process and, to a lesser extent, operational temperatures.","PeriodicalId":127384,"journal":{"name":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW51883.2020.9325851","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Automotive grade parts provide a commercial "off-the-shelf" (COTS) active electronic part alternative for application in satellite and launch vehicles. The results of heavy ion induced Single Event Effects (SEE) measured in various automotive parts are put forth for examination. Automotive grade parts provide additional challenge for die / wafer traceability in the fabrication process and, to a lesser extent, operational temperatures.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
