{"title":"An on-line self-testing switched-current integrator","authors":"Osama K. Abu-Shahla, I. Bell","doi":"10.1109/TEST.1997.639652","DOIUrl":null,"url":null,"abstract":"We describe a CMOS on-line-self-testing, double-sampled, fully-balanced, switched-current bilinear integrator. High spot-defect fault coverage of the integrator, clock generator and checking circuit is achieved under normal process variations.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639652","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
We describe a CMOS on-line-self-testing, double-sampled, fully-balanced, switched-current bilinear integrator. High spot-defect fault coverage of the integrator, clock generator and checking circuit is achieved under normal process variations.
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