P. Nigh, W. Needham, K. Butler, Peter C. Maxwell, R. Aitken, Wojciech Maly
{"title":"So what is an optimal test mix? A discussion of the SEMATECH methods experiment","authors":"P. Nigh, W. Needham, K. Butler, Peter C. Maxwell, R. Aitken, Wojciech Maly","doi":"10.1109/TEST.1997.639727","DOIUrl":null,"url":null,"abstract":"The SEMATECH \"Test Methods Evaluation\" study, Project Number S-121, is an experiment to determine the relative merits of several test methodologies often used by SEMATECH member companies and other IC manufacturers. Conclusions drawn from the experiment thus far have indicated that each test methodology uniquely detects defects. This experimentation and analysis would not have been possible outside a consortium setting such as SEMATECH. Its conclusions may affect other major segments of the industry, including ATE manufacturers, CAD vendors, and academia. This paper gives a brief overview of the experiment and summarizes its findings.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"102","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639727","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 102
Abstract
The SEMATECH "Test Methods Evaluation" study, Project Number S-121, is an experiment to determine the relative merits of several test methodologies often used by SEMATECH member companies and other IC manufacturers. Conclusions drawn from the experiment thus far have indicated that each test methodology uniquely detects defects. This experimentation and analysis would not have been possible outside a consortium setting such as SEMATECH. Its conclusions may affect other major segments of the industry, including ATE manufacturers, CAD vendors, and academia. This paper gives a brief overview of the experiment and summarizes its findings.
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