IEEE P1149.4-almost a standard

A. Cron
{"title":"IEEE P1149.4-almost a standard","authors":"A. Cron","doi":"10.1109/TEST.1997.639611","DOIUrl":null,"url":null,"abstract":"The IEEE P1149.4 Mixed-Signal Test Bus Working Group is on the cusp of delivering a document that will finally standardize the architecture for, and the method of access to, the analog portion of mixed-signal circuits for test and diagnostic applications. This Standard will have the same profound effect on the design and test community that IEEE 1149.1 had previously. P1149.4 gives the test infrastructure the capability to measure discrete impedances external to devices supporting the Standard using a 6-wire bus. This bus uses 4 of the same signals used today to support 1149.1 compliant devices and subsystems. This paper will detail the basic architecture; give some design-specific information and data learned through the Standard's development process; relate results from several test devices; and provide a basic example of usage.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"18","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639611","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 18

Abstract

The IEEE P1149.4 Mixed-Signal Test Bus Working Group is on the cusp of delivering a document that will finally standardize the architecture for, and the method of access to, the analog portion of mixed-signal circuits for test and diagnostic applications. This Standard will have the same profound effect on the design and test community that IEEE 1149.1 had previously. P1149.4 gives the test infrastructure the capability to measure discrete impedances external to devices supporting the Standard using a 6-wire bus. This bus uses 4 of the same signals used today to support 1149.1 compliant devices and subsystems. This paper will detail the basic architecture; give some design-specific information and data learned through the Standard's development process; relate results from several test devices; and provide a basic example of usage.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
IEEE p1149.4——几乎是一个标准
IEEE P1149.4混合信号测试总线工作组即将发布一份文件,该文件将最终标准化用于测试和诊断应用的混合信号电路的模拟部分的体系结构和访问方法。该标准将对设计和测试界产生与IEEE 1149.1相同的深远影响。P1149.4使测试基础设施能够使用6线总线测量支持标准的设备外部的离散阻抗。该总线使用目前使用的4个相同信号来支持1149.1兼容的设备和子系统。本文将详细介绍系统的基本架构;提供一些在标准开发过程中获得的特定设计信息和数据;将几个测试设备的结果联系起来;并提供一个基本的用法示例。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
An on-line self-testing switched-current integrator IEEE P1149.4-almost a standard Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits Incorporating physical design-for-test into routing So what is an optimal test mix? A discussion of the SEMATECH methods experiment
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1