An approach to modeling and testing memories and its application to CAMs

Abstract

An approach to modeling and testing memories is presented and illustrated using an n-word by l-bit (n/spl times/l) static content-addressable memory (GAM) array for cell input stuck-at faults. An input stuck at fault model for a CAM is defined, and a test of length 7n+2l+5 with 100% fault coverage with respect to this fault model is constructed. This test also detects all the usual cell stuck-at and transition faults. Finally, some design-for-testability (DFT) modifications facilitating a further reduction of this test's length are proposed.